Used automation

Trusted Seller
Keysight (Agilent) 4155B
- Manufacturer: Agilent - Keysight
- Model: 4155B
Semiconductor Parameter Analyzer The 4155B Semiconductor Paramer Analyzer is used to evaluate materials with measurements to 1 fA and 1 ÂµV, automatically extract process parameters without manually manipulating ...
Cary, NC
Agilent/Keysight 4155A
- Manufacturer: Agilent - Keysight
- Model: 4155A
The 4155A Semiconductor Parameter Analyzer offers high-resolution/accuracy and a wide range; I: 10 fA to 100 mA (50 fA offset accuracy), V: 1 micro V to 100 V, fully automated I-V sweep measurements with dc or pu...
$10,448 USD
Farmingdale, NJ
Trusted Seller
KOLLMORGEN CR03200-000000 Servo Driver Used
- Manufacturer: Kollmorgen
Removed From: Ranger Automation Robot MOD NO CR03250 V 115/230 INPUT 4.5 ADC INPUT OUTPUT 3 AMPS/PH .5/1.1 KW .63/1.4 KW Expedited shipping services are available upon request. All taxes due are the resp...
$995 USD
Holly, MI
Trusted Seller
Agilent 4155A
- Manufacturer: Agilent - Keysight
- Model: 4155A
Semiconductor Parameter Analyzer The 4155A Semiconductor Parameter Analyzer offers high-resolution/accuracy and a wide range. I: 1 fA to 100 mA (20 fA offset accuracy) V: 1 micro V to 100 V fully automated I-V sw...
Cary, NC
Trusted Seller
Keysight 4155A
- Manufacturer: Agilent - Keysight
- Model: 4155A
Semiconductor Parameter Analyzer The 4155A Semiconductor Parameter Analyzer offers high-resolution/accuracy and a wide range. I: 1 fA to 100 mA (20 fA offset accuracy) V: 1 micro V to 100 V fully automated I-V sw...
Cary, NC
Trusted Seller
Yestech F1 AOI System
- Manufacturer: Yestech
- Model: F1
Yestech F1 AOI System Fully Automated System Inline 5 Camera System 1 Downward Looking camera (Hi Res) 4 side angle cameras 0201 Capable SMEMA Very Clean Fully Functional
St. Petersburg, FL
Trusted Seller
Rudolph / August NSX 95
- Manufacturer: Rudolph
- Model: NSX-95
Automated Defect Inspection
United States
Trusted Seller
Acculogic Sprint 4510 SpeedPlus AFTS Flying Probe
- Manufacturer: Acculogic
Acculogic Sprint 4510 AFTS Mixed Signal Flying Probe Sprint 4510 AFTS Mixed Signal Flying Prober In-Circuit Tester In-Line System 4 Head System Sprint Cage II Windows XP OS Operations, Programming and Maintenance...
St. Petersburg, FL
Trusted Seller
Yestech YTX-X1 X-ray System
- Manufacturer: Yestech
Yestech YTX-X1 X-Ray System Automated In-line X-Ray Inspection System Maintenance free Tube Sealed reflection target 130 Kv 5 micron spot size 39-watt max. output CAD Input: Pick and place data, CAD x-y data CAD...
St. Petersburg, FL
Trusted Seller
2007 Yestech YTX-X1
- Manufacturer: Yestech
Yestech YTX-X1 X-Ray System Automated In-line X-Ray Inspection System Vintage: 2007 Maintenance free Tube Sealed reflection target 130 Kv 5 micron spot size 39-watt max. output CAD Input: Pick and place data, CAD...
St. Petersburg, FL
Trusted Seller
UVP Blak-Ray B-100YP UV Ultraviolet Lamp and Ballast Lot of 2 No Bulbs Surplus
- Manufacturer: UVP Blak-Ray
“Removed from a Genmark Automation 300mm Sort-Max Model 310 Wafer Sorter System” UVP Blak-Ray B-100YP UV Ultraviolet Lamp and Ballast Lot of 2 No Bulbs Surplus Lot of 2 Removed from a Genmark Automation 300mm Sor...
$510 USD
Albuquerque, NM
Trusted Seller
AOI SYSTEMS SCANSPECTION AOI SYSTEM
- Manufacturer: AOI SYSTEMS
AOI Systems (UK) ScanSpection In-line AOI System Brand: AOI Systems Limited Model: ScanSpection Year: Type: In-line AOI Automated Optical Inspection The economic realities of quality control, rework cost and nee...
El Paso, TX
Trusted Seller
KLA AIT II system
- Manufacturer: KLA-Tencor
- Model: AIT II
Wafer size: 6" It is complete and has no known issues OEM Model Description The AIT II is a patterned wafer inspection system for 150 to 300 mm wafers that provides fast, accurate feedback on process tool perf...
United States
Trusted Seller
Veeco Digital Instruments Dimension Large Sample Scanning Atomic Force microscope, LS-SPM with Nanoscope III controller and LSS large sample scanning stage
- Manufacturer: Veeco - Sloan
- Model: Dimension
Veeco Digital Instruments Dimension Large Sample Scanning Atomic Force microscope, LS-SPM with Nanoscope III controller and LSS large sample scanning stage Nanoscope III SPM and controller LSS large sample scan...
United States
Trusted Seller
Nordson Yestech FX-940 3D AOI System
- Manufacturer: Nordson
- Model: FX-940
Nordson Yestech FX-940 3D AOI System Automated Optical Inspection System DOM: 12/2015 3D Inspection Proprietary megapixel color imaging Capture on the fly technology 1 top-down and 4 side angle cameras Qui...
Arizona, USA