• SOPRA Spectroscopic Ellipsometer

        sopra spectroscopic ellipsometer details sopra spectroscopic ellipsometer specification - uv-visible range 250nm to 1000nm sample dimensions: up to 200mm beam spot size: 3mm x 12mm (usually at 75o, can be changed...

        No price
        Lake Mary, FL, USA
      • Inomtech Products Compel ELC-10 54803

        • Manufacturer: Inomtech Products

          ellipsometer. more information come. contact us for details. sold as is, parts.

          Freehold Township, NJ, USA
        • Gaertner L2W16D.830 58267

          • Manufacturer: Gaertner

            multiwavelength 200mm ellipsometer. missing computer and stage driver. two wavelength ellipsometers use additional laser sources to analyze difficult films. 8 in. dia. stage with motorized stage, no controller. sol...

            Freehold Township, NJ, USA
          • Sun International Sopra GESP-5 58885

            • Manufacturer: International

              variable angle broadband spectroscopic ellipsometer. ellipsometer for complicated film stacks, mapping film thickness and optical properties. has pmt detector. wavelength: 250nm to 850nm. user friendly windows® b...

              Freehold Township, NJ, USA
            • Gaertner L106C 57351

              • Manufacturer: Gaertner

                large stage ellipsometer. permits noncontact thickness and refractive index measurements of thin transparent and semi-transparent films. manual hand positioning 15 in. dia. stage. pc with windows based software. ...

                Freehold Township, NJ, USA
              • Gaertner L26 58135

                • Manufacturer: Gaertner

                  simple manual ellipsometer with pc controller. manual stage. pc controller with software. reliable hene laser source. small 15 micron measuring spot. 115v, 50/60 hz.

                  Freehold Township, NJ, USA
                • Rudolph Auto El III 59156

                  • Manufacturer: Rudolph

                    ellipsometer. displays film thickness, index, order thickness, substrate n and k on transparent films. max. sample size: 6 in. x 6 in. variable angle of incidence, manual adjust. single wavelength: 632.8nm. null ...

                    Freehold Township, NJ, USA
                  • J.A. Wolllam Co., Inc. AccuMap-SE V-15 Spectroscopic ellipsometer

                    • Manufacturer: J A Wolllam Co, Inc

                      yes. wolllam co., inc., spectroscopic ellipsometer here we offer a j.a. wolllam co., inc., spectroscopic ellipsometer. characterization of thin film uniformity of large plates is now even easier. the accumap...

                      Borken, Germany
                    • Rudolph AutoEL III 2B 4A Automatic Ellipsometer

                      • Manufacturer: East

                        this rudolph autoel iii automatic ellipsometer (model iii 2b, 4a) looks to be in good cosmetic condition, showing some signs of wear. it powers up, and the digital display is bright and clear, and it responds to ...

                        Gilroy, CA, USA