• Camtek 200mm Optical Wafer Inspection System w/ Basler A201b Camera (Falcon PD)

    • Manufacturer: Camtek

      camtek falcon pd 200mm optical wafer inspection system w/ basler a201b camera the maximum size wafer this machine can process is 200 mm 220vac 50/60hz basler camera, model: a201b (monochrome) basler camera resolu...

      Ventura, CA, USA
    • Unbranded Nanometrics 7201-1267 Wafer Inspection/Measuring Station W/Newport Table

      • Manufacturer: Newport

        template nanometrics 7201-1267 wafer inspection/measuring station w/newport table description ...

        Chandler, AZ, USA
      • Pacific Western PSC Semi-Automatic Wafer Probing Inspection Station P5NMS

        • Manufacturer: Pacific

          n olympus: sz4045 scope pws: p5dms probe 2 desktop computer (windows nt workstation 4.00, intel p4 1.6ghz, 256mb ram, 40gb hdd, 1.44 floppy, cd rom) , viewsonic e70f 17 monitor, keyboard & ps2 mouse , please cont...

          Ventura, CA, USA
        • $18,000
          Ventura, CA, USA
        • Mactronix AE1-600 52989

          • Manufacturer: Mactronix

            automatic wafer sorting system. transfers wafers between two 25 slot cassettes stacked vertically. transfers may be accomplished through keyboard commands and may be programmed for specific customized sequences.

            Freehold Township, NJ, USA
          • H-Square SQ22131-1 35639

            • Manufacturer: H-Square

              visual inspection station. lifts wafers from boat to allow visual inspection.

              Freehold Township, NJ, USA
            • Fortrend Engineering F2225 53910

              • Manufacturer: Fortrend Engineering

                wafer transfer system for 4 in. substrates. 2 stage wafer transfer. 120v, 50/60 hz, ce.

                Freehold Township, NJ, USA
              • August Technology NSX-85 57564

                • Manufacturer: August Technology

                  automated defect inspection system. inspection of whole wafers, sawn wafers, jedec trays, auer boats, die in gel/waffle paks, mcm’s. detects defects down to 0.5 micron. automated wafer mapping and identification....

                  Freehold Township, NJ, USA
                • Tencor SURFSCAN AIT Model 8010 40884

                  • Manufacturer: Tencor

                    advanced in-line defect inspection system. automated full wafer inspection system for detecting particles as small as 0.10 micro-meters on bare silicon and patterned process wafers. high detection sensitivity eve...

                    Freehold Township, NJ, USA
                  • Wyko BP2000W 39319

                    • Manufacturer: Wyko

                      bump measurement profiling system. the right inspection tool for flip-chip process control. repeatably measures solder bump heights, from 150 micro-meters or more for standard flip-chip bumps down to a few micron...

                      Freehold Township, NJ, USA