- specially featured
- Semiconductor Equipment
- standard configuration, see specification
- Condition info:
- Number of units:
- Xray source specifications:
- see specification attached
- Subcategory 2:
- Laboratory equipment
- Subcategory 3:
- Xray fluorescence spectrometers
X-Ray fluorescence for analysis of materials (such as liquids and solid states) in order to obtain information about thickness, concentrataion, etc.
Measurement system for layer thickness analysis of metallic surfaces and evaluation of concentrations of solutions (Au, Ni, Sn, Cu, Ag).
System is fully packed on pallette (241kg, 1mx0,9mx1,5m)
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