2000 Oxford Instruments CMI 950
Location:
Regensburg, Germany
Model:
CMI 950

Specifications

Condition:
used
Year:
2000
Note:
specially featured
Division:
Semiconductor Equipment
Accessories:
standard configuration, see specification
Condition info:
Good
Number of units:
1
Xray source specifications:
see specification attached
Subcategory:
Spectrometers
Subcategory 2:
Laboratory equipment

Description

X-Ray fluorescence for analysis of materials (such as liquids and solid states) in order to obtain information about thickness, concentrataion, etc.
Measurement system for layer thickness analysis of metallic surfaces and evaluation of concentrations of solutions (Au, Ni, Sn, Cu, Ag).
System is fully packed on pallette (241kg, 1mx0,9mx1,5m)