Tektronix BSA175C in United States
United States
$99,000 USD


Test and Measurement
Normal or Inverted
LVTTL (<0.5 V Low, >2.5 V High)
+1.2 V
100 fs
Logic family:
LVTTL (<0.5 V Low, >2.5 V High)
Output levels:
1000 mV nominal (0 V to 1 V low-high)
Pattern depth:
Pattern capture length up to 128 Mb
Max. data rate:
17.50 Gbps
Min. data rate:
500.00 Mbps
Trigger output:
Provides a pulse trigger to external test equipment
Data rate range:
0.5 - 17.5 Gb/s
Max. clock rate:
17.5 GHz
Output levels 2:
>300 mV amplitude, 650 mV offset
Transition time:
<500 ps
Hardware patterns:
Industry-standard Pseudo-random (PRBS) of the type 2
Maximum frequency:
<4000 markers/s recommended
Minimum pulse width:
128 clock periods
Range above 1.1 ghz:
3 ns
Range up to 1.1 ghz:
30 ns
Threshold alignment:
Can auto-align to differential crossing point
Minimum pulse width 2:
128 serial clock periods
Max. prbs pattern(2n-1):
Maximum repetition rate:
512 serial clock periods
Ram pattern user defined:
128 bits to 128 Mb, 128-bit increments
Maximum input signal swing:
2 Vp-p
Bertscope burst analysis timing:
BERTScope word size is 128 bits
Telecom, datacom
Subcategory 2:
Bert, error analyzers


Tektronix BSA175C-JMAP-PCISTR-STR 17.5Gb/s BER Analyzer
Integrated, Calibrated Stress Generation.
Electrical Stressed Eye Testing.
Jitter Tolerance Compliance Template Testing with Margin Testing.
Pattern generation and Fast Input Rise Time / High Input Bandwidth Error
Physical Layer Test Suite with Mask Testing, Jitter Peak, BER Contour,
and Q-factor Analysis for Comprehensive Testing with Standard or User-
defined Libraries of Jitter Tolerance Templates.
Integrated Eye Diagram Analysis with BER Correlation.
Patented Error Location Analysis.
OPTS001 includes:
JMAP = Jitter Decomposition SW.
PCISTR = Extended Stress Generation, requires STR.
STR = Stressed Signal Generation, Includes option ECC, MAP,PL,XSSC,JTOL.
The BERTScope™ BSA Series Bit Error Rate Testers provide a new approach to signal integrity measurements of serial data systems. Perform bit error ratio detection more quickly, accurately, and thoroughly, by bridging eye diagram analysis with BER pattern generation. The BERTScope BSA Series lets you easily isolate problematic bit and pattern sequences, then analyze further with seven types of advanced error analysis that deliver unprecedented statistical measurement depth.
Pattern Generation and Error Analysis, highspeed BER Measurements up to 26 Gb/s
Integrated Stress Generator for stressed eye sensitivity (SRS) and jitter tolerance compliance testing
Integrated BER correlated eye diagram analysis with pass/fail masks for PCI Express, USB, SATA and other serial standards
Error Location and BER contour analysis on PRBS and other digital signals up to 26 GB/sec
Optional Jitter Map provides fast jitter decomposition, accurate stress calibration at the DUT input
Optional Digital Pre-emphasis Processor provides user controlled pre-emphasis on pattern generator supplied data
Optional Clock Recovery Units provide clock recovery up to 28.6 Gb/s
Characteristics of the
(Error Detector):
Clock input frequency range: 0.5 - 17.5 Gb/s (A full- or half-rate clock may be used for data rates above 11.2 Gb/s)
Clock/data delay
Range up to 1.1 GHz: 30 ns
Range above 1.1 GHz: 3 ns
Resolution: 100 fs
Data input:
Data rate range: 0.5 - 17.5 Gb/s
Configuration: Differential
Format: NRZ
Polarity: Normal or Inverted
Threshold Alignment: Can auto-align to differential crossing point
Maximum input signal swing: 2 Vp-p
Intrinsic Transition Time: 16 ps typical, 10/90%, single ended (equivalent to >20 GHz detector bandwidth). Measured at input, ECL levels
Hardware patterns: Industry-standard Pseudo-random (PRBS) of the type 2
n – 1
where n = 7, 11, 15, 20, 23, 31
RAM pattern user defined: 128 bits to 128 Mb, 128-bit increments
Ram pattern library: Wide variety including SONET/SDH, Fibre Channel based such as k28.5, CJTPAT; 2
patterns where n = 3, 4, 5, 6, 7, 9; Mark Density patterns for 2
where n = 7, 9, 23; and many more
RAM pattern capture: Capture incoming data up to 128 Mb in length. Edit captured data, send to pattern generator, error detector,