Agilent HP 8720C in United
Location:
United States
Price:
$12,300 USD

Specifications

Condition:
used
Status:
Discontinued
Division:
Test and Measurement
Alternative:
N5230A PNA-L Network Analyzer (Option 220/225)
Instrument type:
Vector, S-Parameter
Low end frequency limit:
50.00 MHz
High end frequency limit:
20.00 GHz
Subcategory:
Vector
Subcategory 2:
Analyzers network

Description

AGILENT HP 8720C WITH OPTION 001, NEW CALIBRATION, IN STOCK
*IN STOCK*
Our Agilent 8720C has option 001 (
1 Hz Frequency Resolution) installed on it and also comes with a NIST Traceable Calibration with Certificate.
Accessories Included:
Power Cord, Manual on CD, Calibration Certificate
The Agilent 8720C vector network analyzer characterizes RF and microwave components down to 50 MHz and up to 20 GHz. This analyzer includes a fast-sweeping synthesized source, S-parameter test set, tuned receiver, and large color display in a single package.
The Agilent 8720C is an ideal choice for cost- and space-conscious engineers in research and development, manufacturing, incoming inspection, or quality assurance.
The Agilent
8720C
vector network analyzer characterizes RF and microwave components down to 50 MHz and up to 20 GHz. This analyzer includes a fast-sweeping synthesized source, S-parameter test set, tuned receiver, and large color display in a single package. The Agilent 8720C is an ideal choice for cost- and space-conscious engineers in research and development, manufacturing, incoming inspection, or quality assurance.
Fast-sweeping built-in synthesized source with optional 1 Hz frequency resolution
Integrated switching test set measures all four S-parameters with a single connection
Vector accuracy enhancement
Optional time domain capability computes and displays response versus time or distance
Optional Solid State Switch allow simultaneous measurement of forward and reverse parameters and continuous update of all four S-parameters as required for two-part error correction
Productivity is enhanced with pass/fail testing, direct printer/plotter output of results, advanced marker functions, and save/recall of test configurations
Two independent display channels for simultaneous measurement of reflection and transmission characteristics