The TDS7000B Series' superior measurement fidelity, analysis, and uncompromised usability combine to simplify and speed the design of high-speed, complex systems. This family offers a superior solution to the challenging signal integrity issues faced by designers verifying, characterizing and debugging sophisticated electronic designs.
Tektronix's exclusive DPX(R) acquisition technology enables waveform capture rates up to 400,000 wfms/s to quickly find rare glitches in seconds or minutes, instead of hours or days.
Software solutions deliver domain expertise for advanced analysis and compliance testing, while the OpenChoice(R) architecture enables users to integrate their expertise through the ability to easily write custom programs or utilize popular commercial software.
The intuitive graphical user interface delivers sophisticated capability to advanced users without intimidating occasional users.
Up to 1.5 GHzTrue Analog Bandwidth and Down to 43 ps Risetime (20% - 80%) > 400,000 wfms/s Waveform Capture Rate, powered by exclusive DPX™ acquisition technology 20 GS/s Real-time Sample Rate Exceptional Delta-time Accuracy for High-confidence in Critical Timing Measurements Powerful Triggering Features for Fast Detection of Relevant Faults Communications Mask Testing Up to 4.25 Gb/s Rates Clock Recovery from Serial Data Streams up to 3.125 Gb/s Up to 64 MB Record Length with MultiView Zoom™ for Quick Navigation of Long Records TekConnect® Interface for High Fidelity Connection Classic Direct Controls, Touch-sensitive Display, or Mouse Navigation OpenChoice™ with Windows 2000 Delivers Built-in Networking and Analysis XGA 1024x768 display
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