Agilent HP 4291A in Taiwan

Agilent HP 4291A in Taiwan

Location:
Taiwan
Price:
$10,000 USD
Manufacturer:
Agilent

Specifications

Condition:
used
Mode:
Continuous, Single, Manual, Number of groups
Type:
Linear, Log, Zero-span, List
Level:
>-6 dBm (typical)
Setup:
Start Stop, Center Span
Status:
Discontinued
Level 2:
2 dBm (typical)
Level 3:
TTL
Division:
Test and Measurement
Averaging:
Sweep average, Point average
Direction:
Up sweep, Down sweep
Frequency:
10 MHz (typical)
Parameter:
Frequency, OSC level (voltage), DC bias voltage/current
Delay time:
Point delay time, Sweep delay time
Alternative:
E4991A RF Impedance/Material Analyzer
Frequency 2:
10 MHz (nominal)
Power range:
‑67 dBm to 7 dBm
Pulse width:
>2 µs (typical)
Current range:
4 µArms to 20 mArms
Voltage range:
0.2 mVrms to 1 Vrms
Connector type:
APC7
Dc current level:
20 µA to 100 mA, ‑20 µA to ‑100 mA
Dc voltage level:
0 to ±40 V
Agilent 4291a opts:
w/001
Dc level resolution:
1 mV, 20 µA
Frequency resolution:
1 mHz
Impedance parameters:
|Z|,
Calibration functions:
Open/Short/50 Ω calibration, Low loss calibration
Compensation functions:
Open/Short/Load compensation, Port extension, Electric length
Number of measuring points:
2 to 801 points
Category:
Analyzers
Subcategory:
Impedance

Description

Agilent 4291A Opts: w/001
RF IMPEDANCE/MATERIAL ANALYZER 1MHz-1.8GHz, w/opt.001.Test Station, Low impedance fixture
Condition:
used
For surface mount component evaluation and material testing the HP
4291A
RF impedance / material analyzer is an integrated package designed to provide accurate testing at higher frequencies.
Impedance parameters: |Z|,
, |Y|,
, R, X, G, B, C
, C
, L
, L
, R
, R
, D, Q, |Γ|,
, Γ
Broad frequency coverage from 1 MHz to 1.8 GHz for testing RF compenents and materials
Frequency resolution: 1 mHz
Improved measurement accuracy and repeatability over an impedance range of 0.1 Ω to 50 kΩ
OSC levels
Voltage range: 0.2 mVrms to 1 Vrms
Current range: 4 µArms to 20 mArms
Power range: ‑67 dBm to 7 dBm
DC bias (Option 001)
DC voltage level: 0 to ±40 V
DC current level: 20 µA to 100 mA, ‑20 µA to ‑100 mA
DC level resolution: 1 mV, 20 µA
Surface mount device (SMD) test fixtures for different sizes of chip capacitors and inductors
Dielectric test fixture and built-in function for measuring permittivity, including Cole-Cole plot relaxation time (with Option 002 and the 16453A)
Magnetic test fixture and built-in function for measuring permeability of ferrite material (with Option 002 and 16454A)
Direct impedance and material parameter measurement versus time, humidity, or temperature (with Option IC2 and an external temperature chamber)
Evaluate components with dc bias up to ±100 mA and ±40 V (with Option 001)
Monitor test signals applied to the DUTs
Simulate a component with equivalent circuit analysis
Store the measurement data and analyzer settings on the DOS and LIF compatible 1.4 MB flexible disk drive and RAM disk memory
Markers and marker utilities
Limit lines for go/no-go testing
Sweep
Parameter: Frequency, OSC level (voltage), DC bias voltage/current
Setup: Start Stop, Center Span
Type: Linear, Log, Zero-span, List
Mode: Continuous, Single, Manual, Number of groups
Direction: Up sweep, Down sweep
Number of measuring points: 2 to 801 points
Averaging: Sweep average, Point average
Delay time: Point delay time, Sweep delay time
Calibration functions: Open/Short/50 Ω calibration, Low loss calibration
Compensation functions: Open/Short/Load compensation, Port extension, Electric length
External reference input
Frequency: 10 MHz (typical)
Level: >-6 dBm (typical)
Internal reference output
Frequency: 10 MHz (nominal)
Level: 2 dBm (typical)
External trigger input
Level: TTL
Pulse width: >2 µs (typical)
Display: Color CRT, 7.5 inch, 512 x 400 resolution, 2 channels; single, dual split or overwrite, graphic, tabular; 1 trace/channel for measurement, 16 traces/channel for memory
HP-IB interface: SH1, AH1, T6, TE0, L4, LE0, SR1, RL1, PP0, DC1, DT1, C1, C2, C3, C4, C11, E2
Connector type: APC7