Agilent HP 4291B in United

Agilent HP 4291B in United States

United States
$11,500 USD


Test and Measurement
E4991A RF Impedance/Material Analyzer
Operating frequency:
1 MHz to 1.8 GHz
Frequency resolution:
1 mHz
Impedance parameters:
|Z|, θ


Agilent 4291B
4291B Impedance Material Analyzer 1MHz to 1.8GHz 0.8% basic accuracy, Measurements: |Z|, |Y|, R, X, G, B, CP , CS, L P, L S, R P, RS, D, and Q; 8 inch color TFT display, Built-in 3.5 inch floppy disk drive GPIB. Unit only No test fixtures 4291B Impedance Material Analyzer 1MHz to 1.8GHz 0.8% basic accuracy, Measuremen
The Agilent
RF impedance/material analyzer provides a total solution for high-accuracy and easy measurement of surface-mount components and dielectric/magnetic materials.
Basic impedance accuracy is +/- 0.8%. High Q accuracy enables low-loss component analysis. An internal synthesizer sweeps frequency from 1 MHz to 1.8 GHz with 1 mHz resolution. A 1.8-m error-less cable connects the analyzer to a test station so you can extend your test point away from the analyzer without losing accuracy. Advanced calibration and error compensation function eliminate measurement error factors in fixtures and assure high accuracy and repeatability at DUT/MUT.
The Agilent 4291B also provides automatic level control and monitor of test signals by using IBASIC programming; devices can be measured under a constant voltage or current. Measure bias dependent impedance characteristics with optional dc bias (up to 40 V and 100 mA). At the push of a button, the built-in Equivalent Circuit Analysis function automatically calculates the circuit constant values of five circuit models.
The Agilent 4291B has two measurement channels; each channel can be set to measure a single (for example, Z) or dual (for example, Z-theta) impedance parameter. The color TFT with split display can show both active traces and memory traces (stored in RAM). A built-in floppy disk drive stores programs and test data in either LIF or MS-DOS format. With built-in IBASIC, you can control external test equipment such as a temperature chamber or wafer prober directly from the Agilent 4291B. You do not need a separate instrument controller.
The Agilent 4291B enables easy and sophisticated material evaluation and improves material evaluation quality and efficiency. It provides a total dielectric/magnetic material measurement solution for the frequency range, 1 MHz to 1 GHz.
Four component test fixtures (DUT size: 0.5 mm to 20 mm)
Independent parameter selection in 2 channels
Direct read-out permittivity, permeability (option)
Two material fixtures (operating temperature: -55deg C to +200deg C)
Versatile analysis (temperature, cole-cole plot, relaxation time)
Sweep parameters (frequency, ac level, dc bias, temperature)
Impedance parameters: |Z|, θ
, |Y|, θ
, R, X, G, B, C
, C
, L
, L
, R
, R
, D, Q, |Γ|, θ
, Γ
, Γ
Frequency characteristics
Operating frequency: 1 MHz to 1.8 GHz
Frequency resolution: 1 mHz