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we are not able to fully test this module. the wafer blade extends and the top rotates, both easily with light hand pressure. we were not able to raise the top due to lack of a motor drive.
three dimensional afm atomic force microscope metrology system. field proven afm scanning probe technology delivers accurate, nondestructive 3d measurements enabling feature shape control, full sid...
this digital instruments veeco metrology group dimension vx 310 atomic force profiler for 12-inch wafers looks to be in good cosmetic condition, showing some signs of wear. it does have some dents ...
d5000 afmrefurbishedwindows 7manuals, software, pc etc... includedcomes with warrantysetup and training availablecall with any questions p m ... read more
product id # c98892 this digital instruments veeco metrology group dimension vx 310 atomic force profiler for 12-inch wafers looks to be in go ... read more
darkfield defect inspection, 2x 300mm load ports asyst smif-300fl stage: y-pre load magnets is broken laser head "end of life"