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we are not able to fully test this module. the wafer blade extends and the top rotates, both easily with light hand pressure. we were not able to raise the top due to lack of a motor drive.
three dimensional afm atomic force microscope metrology system. field proven afm scanning probe technology delivers accurate, nondestructive 3d measurements enabling feature shape control, full sid...
this digital instruments veeco metrology group dimension vx 310 atomic force profiler for 12-inch wafers looks to be in good cosmetic condition, showing some signs of wear. it does have some dents ...
darkfield defect inspection, 2x 300mm load ports asyst smif-300fl stage: y-pre load magnets is broken laser head "end of life"
template mosaid systems ms3490 memory test system m349011 p/n 1001450-00 rev. e ms-3490 ... read more
for your consideration: upgraded sonoscan d6000 sn 2238 - windows 2000 - industrial pc with pentium 3 and 768m of memory - additional cooling ... read more