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three dimensional afm atomic force microscope metrology system. field proven afm scanning probe technology delivers accurate, nondestructive 3d measurements enabling feature shape control, full sid...
darkfield defect inspection, 2x 300mm load ports asyst smif-300fl stage: y-pre load magnets is broken laser head "end of life"
lepel power: 460v 3ph 60hz 21 amp | lepel dimensions: 43" l x 31" d x 58" t | thomas swan dimensions: 96" l x 42" d x 90" h
digital instruments nanoscope iii spm scanning probe atomic force microscope afm manufacturer: digital instruments model: nanoscope iii condition: used. everything looks clean and nothing is appare...
template nanometrics 7201-1267 wafer inspection/measuring station w/newport table ... read more
here is a sonoscan d6000 in great condition. i have been using this in my lab for almost 8 years and recently upgraded to a newer model. i upgraded ... read more