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we are not able to fully test this module. the wafer blade extends and the top rotates, both easily with light hand pressure. we were not able to raise the top due to lack of a motor drive.
three dimensional afm atomic force microscope metrology system. field proven afm scanning probe technology delivers accurate, nondestructive 3d measurements enabling feature shape control, full sidewall scans, an...
g115404 sloan dektak 3030 st surface texture analysis system condition: for parts or not working
#07368 veeco optical profiling system wyko nt9300 spec measurement items : surface shape, roughness, level difference etc. traveling range for z direction : 0.1 nm to 1 mm stage : φ8'' external dimension : w 900 ...
darkfield defect inspection, 2x 300mm load ports asyst smif-300fl stage: y-pre load magnets is broken laser head "end of life"
mahr xc-20 surface contour measuring machine marsurf complete condition: used