Location:
Freehold Township, NJ
Price:
$18,000 USD
Manufacturer:
Gaertner
Model:
L106C

Specifications

Condition:
used
Stock number:
57351
Subcategory:
Wafer analysis

Description

Large Stage Ellipsometer. Permits noncontact thickness and refractive index measurements of thin transparent and semi-transparent films. Manual hand positioning 15 in. dia. stage. PC with Windows based software. 115V, 60 Hz.