Location:
Freehold Township, NJ
Price:
$4,950 USD
Manufacturer:
Rudolph
Model:
Auto El III

Specifications

Condition:
used
Stock number:
59156
Subcategory:
Wafer analysis

Description

Ellipsometer. Displays film thickness, index, order thickness, substrate N and K on transparent films. Max. Sample Size: 6 in. x 6 in. Variable angle of incidence, manual adjust. Single Wavelength: 632.8nm. Null seeking operating principle.