- Freehold Township, NJ, USA
- International semiconductor equipment
Variable Angle Broadband Spectroscopic Ellipsometer. Ellipsometer for complicated film stacks, mapping film thickness and optical properties. Has PMT detector. Wavelength: 250nm to 850nm. User friendly Windows® based interface. SOPRA ellipsometer that had been serviced by Angstrom Sun Technologies. Allows for variable angle broadband spectroscopic ellipsometry. Motorized 8 in. stage for 3D sample plots. Camera with zoom lens.
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