The Spirent SX Data Link Simulators create the same delay and error characteristics caused by long distance terrestrial and satellite data links. By providing very realistic simulations of actual network conditions, they allow engineers to stress test new equipment and network applications under repeatable and controllable conditions.
Utilizing dual-channel, full-duplex operation, these simulators provide bi-directional testing with programmable delays, random bit errors and burst errors. Multiple delay and error events can be programmed into complex sequences to simulate a wide variety of chronic and periodic conditions or events such as peak traffic times and equipment overloads.
Typical simulator applications include testing the operation, performance and reliability of multiplexers, bridges, encrypters, network applications and other communications hardware and software. When used for link simulation, these simulators physically connect directly between two pieces of equipment to replace conventional data links such as satellite connections, WANs or telephone networks.
They can also be used in line with a real data link to add additional delays or errors or to simulate the effects of adding an additional link to the system.
Each simulator has two separate channels to simulate the bi-directional characteristics of a full-duplex data link.Each channel operates independently and has both transmit and receive functions. The SX/13 model also permit different delay and error settings for each direction of the full-duplex data stream. Bypass and loopback modes can be selected whenever standard bi-directional flow is not required.
Each channel uses a variable length first-in-first-out delay buffer with user-selectable delay and data rate parameters. These parameters set the length of this buffer which in turn determines the amount of time it takes data to pass through each channel. The maximum delay length depends on the data rate (lower data rates permit longer maximum delays). At the lower rates, delays up to 9,999 ms (just under 10 seconds) are possible. Delays can be specified in milliseconds or bits depending on the measurement requirements of the test.
Each channel has a and a The Random Error Generator simulates background errors caused by Gaussian noise and is active during gaps between error bursts. Random error rates can range from 1 x 10-9 to 1 error per bit for the SX/12 models or from 1 x 10-12 to 1 error per bit for the SX/13. The Random Error Generator normally injects logical errors. However, the SX/13 can also be set to inject BPVs (Bipolar Violations) when bipolar interfaces such as DS1 are used.
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