The SR250 Gated Integrator is a versatile, high-speed, NIM module designed to recover fast analog signals from noisy backgrounds. The SR250 consists of a gate generator, a fast gated integrator, and exponential averaging circuitry.
The gate generator, triggered internally or externally, provides an adjustable delay from a few nanoseconds to 100 ms before it generates a continuously adjustable gate with a width between 2 ns and 15 µs. The gate delay can be set from the front panel or automatically scanned by applying a rear-panel control voltage. Scanning the gate allows the recovery of entire waveforms.
Gate width from 2 ns to 15 µs (expandable to 150 µsec)
Internal rate generator
Active baseline subtraction
Gate output for precise gate timing
Average 1 to 10,000 samples
DC to 20 kHz repetition rate
Low jitter (
Get email updates for Stanford Research Systems SR250