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Stanford Research Systems SR760 DC
Location:
Elgin, IL
Model:
SR760

Specifications

Condition:
used
Division:
Electronic Test Equipment
Condition info:
Refurbished
Subcategory:
Analyzer
Subcategory 2:
Signal analyzer

Description

The SR760 and SR770 are single-channel 100 kHz FFT spectrum analyzers with a dynamic range of 90 dB and a real-time bandwidth of 100 kHz. Additionally, the SR770 includes a low-distortion source which allows you to measure the transfer functions of electronic and mechanical systems.
The speed and dynamic range of these instruments, coupled with their flexibility and many analysis modes, makes them the ideal choice for a variety of applications including acoustics, vibration, noise measurement and general electronic use.
DC to 100 kHz bandwidth
90 dB dynamic range
Low-distortion synthesized source (SR770)
Harmonic, band and sideband analysis
100 kHz real-time bandwidth
Hardcopy output to printers and plotters
GPIB and RS-232 interface