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Stanford Research Systems SR780 100
Location:
Elgin, IL
Model:
SR780

Specifications

Condition:
used
Division:
Electronic Test Equipment
Condition info:
Refurbished
Subcategory:
Analyzer
Subcategory 2:
Signal analyzer
Subcategory 3:
Spectrum analyzer

Description

The SR780 Dynamic Signal Analyzer combines high performance and low cost in a full-featured package. It offers 102.4 kHz dual-channel FFTs with 90 dB dynamic range, 145 dB dynamic range swept-sine measurements, real-time ANSI standard octave analysis, waterfall displays and transient capture.
DC to 102.4 kHz bandwidth
90 dB dynamic range
Low-distortion synthesized source
145 dB dynamic range in swept-sine mode
Real-time octave analysis
Up to 32 Mbyte memory
GPIB and RS-232 interfaces