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Stanford Research Systems SR785 Signal
Location:
Elgin, IL
Model:
SR785

Specifications

Condition:
used
Division:
Electronic Test Equipment
Condition info:
Refurbished
Subcategory:
Analyzer
Subcategory 2:
Signal analyzer

Description

DC to 102.4 kHz Bandwidth
90 dB Dynamic Range
16-bit A/D Conversion
Low Distortion Synthesized Source
ANSI Standard Octave Measurements
145 dB Dynamic Range Swept Sine Mode
Order Tracking
20 Pole/Zero Curve Fitting
Time/Histogram Mode
Internal and External Triggering
File Output to SDF, MAT, UFF, and ASCII
Graphics Output to GIF, EPS, PCX, HPGL
3.5" MS-DOS Compatible Disk Drive
GPIB and RS-232 Interfaces