Wafer Debonder for 150mm Wafers
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triple wavelength prism coupler thin film thickness and refractive index/birefringence measurement system. offers unique advantages over instruments based on ellipsometry or spectrophotometry. no a...
condition info: not specified | basler camera, model: a201b (monochrome) | basler camera resolution: 1 mp, 1008(h) x 1018(v) pixels
template nanometrics 7201-1267 wafer inspection/measuring station w/newport table ...
system is operational and available for demo model: lem-310c s/n: 310020 voltage: 100v current: 3a frequency: & ...
includes: automated die module pick from diced wafer to waffle pack. | condition info: not specified
with light curtains (located in bldg 1382, room h1)
solar cell welding systems, glass washers, sun simulators, laminators, lab & more
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