• KLA P-6 Tencor Surface Profiler

        the p-6 tencor surface profiler offers a combination of advanced features for process development and manufacturing control of scientific research, photovoltaic solar manufacturing, data storage, mems, opto-elect...

        No price
        East Lyme, CT, USA
      • KLA Tencor 5200 61777

        • Manufacturer: KLA Tencor

          automated overlay metrology tool. just removed from a 100mm, 4 in. research facility. was fully functional when shut down for removal.

          Freehold Township, NJ, USA
        • Tencor FLX 2320 61825

          • Manufacturer: Tencor

            thin film stress measurement system. the tencor flx 2320 uses laser scanning technology to provide accurate measurement of thin film stress on all types of films and substrates. stress can be monitored at tempera...

            Freehold Township, NJ, USA
          • Tencor P20H 38497

            • Manufacturer: Tencor

              fully tested and ready to ship! long scan profiler. measurement of vertical features ranging from under 100 angstroms to approximately 0.3mm, with a vertical resolution of 1 or 25 angstroms. ability to fit and le...

              Freehold Township, NJ, USA
            • Tencor P10 59853

              • Manufacturer: Tencor

                high precision surface profiler. provides surface topography measurements on a wide variety of substrates. can quickly characterize step heights, roughness and waviness. two-dimensional traces displays provide ad...

                Freehold Township, NJ, USA
              • 8687 TENCOR 179884 P-2 LONG SCAN PROFILER OPEN FRAME 8" PLATE

                • Manufacturer: International

                  8687 tencor 179884 p-2 long scan profiler open frame 8" platehave key and disksmodel: 179884/ p-2 open frameserial: 059403318" platevolt: 115amp: 4hz: ...

                  Minneapolis, MN, USA
                • Tencor SURFSCAN AIT Model 8010 40884

                  • Manufacturer: Tencor

                    advanced in-line defect inspection system. automated full wafer inspection system for detecting particles as small as 0.10 micro-meters on bare silicon and patterned process wafers. high detection sensitivity eve...

                    Freehold Township, NJ, USA
                  • Unbranded Tencor Prometrix FT-700 Wafer Film Thickness Measurement System (FT-750?)

                    • Manufacturer: Unbranded

                      template tencor prometrix ft-700 wafer film thickness measurement system (ft-750?) description ...

                      Chandler, AZ, USA
                    • Tencor FLX 5200h 48127

                      • Manufacturer: Tencor
                        No price
                        Freehold Township, NJ, USA
                      • 2001 KLA-Tencor 8250 XPT

                        • Manufacturer: KLA-Tencor

                          wafer size: 4inch - 8inch, 3 cassette loading stations, schottky field emission electron source, stage: x-y leadscrew, laser encoder system, position accuracy: <1 micron, varian turbo pump for chamber pumping, sy...

                          No price
                          Berlin, Germany