Used Test & Measurement (Semiconductors)

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National Instruments 185017C-01
- Manufacturer: National Instruments
185017C-01 | PCI-4552, 4 Analog Input, Dynamic Signal Acquisition Board
Cary, NC
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National Instruments 777959-01
- Manufacturer: National Instruments
777959-01 | PCI-1422, 16-Bit, Parallel Digital, Image Acquisition Board
Cary, NC
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National Instruments 190323A-01
- Manufacturer: National Instruments
190323A-01 | PCI-1410, 4-Channel, Nonstandard Analog Image Acquisition Device
Cary, NC
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National Instruments 784060-01
- Manufacturer: National Instruments
784060-01 | NI-6585B, 32 LVDS-Channel, Digital I/O Adapter Module for FlexRIO
Cary, NC
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National Instruments 784364-02
- Manufacturer: National Instruments
784364-02 | NI-5783, 40 MHz, Transceiver Adapter Module for FlexRIO
Cary, NC
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National Instruments 150937-02
- Manufacturer: National Instruments
150937-02 | NI-5761, 500 MHz, 4-Channel Digitizer Adapter Module for FlexRIO
Cary, NC
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National Instruments 184436-01
- Manufacturer: National Instruments
184436-01 | FP-DO-400, 8 Sourcing Outputs, Digital Output Module
Cary, NC
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National Instruments 785641-01
- Manufacturer: National Instruments
785641-01 | FD-11637, 8 AI, IP67, Strain/Bridge Input Device for FieldDAQ
Cary, NC
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National Instruments 785275-01
- Manufacturer: National Instruments
785275-01 | CVS-1459, USB3 Vision Camera Interface, Compact Vision System
Cary, NC
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National Instruments 777313-01
- Manufacturer: National Instruments
777313-01 | AT-DIO-32HS, 32 Digital I/O Line, Digital I/O Board
Cary, NC
Scientific Test HC-500/HC-200
- Manufacturer: Scientific Test
500 Amp High Current Deck On-state current tests such as VT, VF, VCESAT, VDSON and RDSON can be extended to the limits indicated above by use of the High Current Deck (pictured).
$997 USD
Farmingdale, NJ
Scientific Test 6010
- Manufacturer: Scientific Test
Automatic Programmable per step Scanner for multiple device packages Includes one 4 device scanner board, 5 scanner board capability.
$7,500 USD
Farmingdale, NJ
Scientific Test 6008
- Manufacturer: Scientific Test
$7,500 USD
Farmingdale, NJ
LEO 1455 Scanning Electron Microscope (SEM)
- Manufacturer: LEO Electron Microscopy
LEO 1455 Scanning Electron Microscope Capable of handling a full 6in (150mm) wafer Tool unfortunately did not work well after receiving a software and PC upgrade. However, tool may work with some deeper investi...
New York, USA
Cascade Microtech S300 64518
- Manufacturer: Cascade Microtech
Cascade Microtech S300 semi-automatic and manual RF/Microwave Probing System for quick and reliable 300 mm on-wafer test and characterization. The S300 supports wafer sizes and shards from 0.5 in. (1 mm) all the ...
$55,000 USD
Freehold Township, NJ
Tektronix 4210 Test & Measurement (semiconductors)
- Manufacturer: Tektronix
- Model: 4210
Good condition Tektronix 4210 Test & Measurement (semiconductors)s. Located in USA and other countries. Click request price for more information.
USA