2013 Advantest T2000LS
used
- Manufacturer: Advantest
- Model: T2000LS
T2000 LS with RF Option T2000LS with RF Option - Please see PDF for configuration.
Grayslake, IL- Trusted Seller
KLA-Tencor Surfscan 6220 Particle Inspection System
used
- Manufacturer: KLA-Tencor
- Model: Surfscan 6220
KLA-TENCOR SURFSCAN 6220 PARTICLE INSPECTION SYSTEM consisting of: - Model: Surfscan 6220- Particle Inspection System- Bare Wafer Surface Defect Inspection System- Substrate/Sizes: 2", 3", 4", 6" and 8" Wafer Cap...
Decatur, GA - Trusted Seller
Takano Altax 300ex Micro Bump Whole Surface Inspection System
used
- Manufacturer: Takano
Takano Altax 300ex Micro Bump Whole Surface Inspection System consisting of:- Model: Altax 300ex- Micro Bump Whole Surface Inspection System- Substrate/Sizes: 12" Wafer Capable - 40WPH/12 inch high-speed full lot...
Decatur, GA - Trusted Seller
TTVision T224X Inspection Tool
used
- Manufacturer: TT Vision
- Model: T224X
TTVision T224X Inspection Tool consisting of: - Model: T224X- Post Tape Inspection Tool- SN: 23-770-00-A3-00
Decatur, GA - Trusted Seller
KLA-Tencor Surfscan 5500 Inspection System
used
- Manufacturer: KLA-Tencor
- Model: Surfscan 5500
KLA-Tencor Surfscan 5500 Inspection System consisting of:- Model 5500 Main System- Can handle from 2" up to 8"/200mm wafers- Submicron sensitivity, detects 0.2 micron particles- Surface haze detected as low as 0....
Decatur, GA - Trusted Seller
KLA-Tencor AIT II Patterned Surface Defect Inspection System
used
- Manufacturer: KLA-Tencor
- Model: AIT II
KLA-TENCOR AIT II (200mm/300mm) PATTERNED SURFACE DEFECT INSPECTION SYSTEM consisting of: - Model: AIT II- Wafer Size: 200mm- 150/200mm Open Handler - Software Version 5.3.17.4- Double Darkfield Inspection Tool -...
Decatur, GA - Trusted Seller
Rudolph / August NSX-95 Automated Defect Inspection
used
- Manufacturer: Rudolph
- Model: NSX-95
Rudolph / August NSX-95 Automated Defect Inspection consisting of: - Model: NSX-95- NSX Automated Wafer Handling System- WHS (Wafer Handler System) top plate- 4”/6”/8” Wafer Handler- Xandex 350-0002 Pneumatic Die...
Decatur, GA - Trusted Seller
Dage XD7500VR X-ray Inspection System
used
- Manufacturer: Nordson DAGE
- Model: XD7500VR
Dage XD7500VR X-ray Inspection System DOM: 2008 Standalone Open Tube 160kV 70 degree Oblique view 1,500 X Geometric Magnification (7,000 X system magnification) Easy Collision-Free, High Magnification Insp...
North Carolina, USA - Trusted Seller
Rudolph / August NSX-105 Automated Wafer, Die & Bump Inspection
used
- Manufacturer: Rudolph
- Model: NSX-105
Rudolph / August NSX-105 Automated Wafer, Die & Bump Inspection consisting of: - Model: NSX-105- Automated Wafer, Die & Bump Inspection- 4”/6”/8” Wafer Handler- Ultraport top plate- Objectives: 1, 2, 5, 20x - PC...
Decatur, GA - Trusted Seller
Rudolph NSX-115 Advanced Wafer Inspection
used
- Manufacturer: Rudolph
- Model: NSX-115
Rudolph NSX-115 Advanced Wafer Inspection consisting of: - Model: NSX-115- Ultra port quick change top plate & film frame quick change top plate- Ultra port 50/50: - Loadport A is for film frame for 6&8” filmfr...
Decatur, GA - Trusted Seller
KLA-Tencor Surfscan 6400 Particle Inspection System
used
- Manufacturer: KLA-Tencor
- Model: Surfscan 6400
KLA-TENCOR SURFSCAN 6400 Particle NSPECTION SYSTEMconsisting of:- Model: Surfscan 6400- Particle Inspection System- System can handle up to 200mm capable- Cassette Handling: Single puck handling from single casse...
Decatur, GA - Trusted Seller
KLA-Tencor Surfscan 6420 Particle Inspection System
used
- Manufacturer: KLA-Tencor
- Model: Surfscan 6420
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Decatur, GA - Trusted Seller
Nordson / Dage Series 4000 Bond Tester
used
- Manufacturer: Nordson DAGE
- Model: 4000
Nordson / Dage Series 4000 Bond Tester consisting of: - Leica S6 Microscope- PC & Monitor- Mouse and Keyboard- Ion Gun Choice of One Below Included with System: - BS250R - BS5KGR - CBP1KG(Additional Available for...
Decatur, GA - Trusted Seller
KLA Tencor Surfscan 6200 Particle Inspection System
used
- Manufacturer: KLA-Tencor
- Model: Surfscan 6200
KLA-TENCOR SURFSCAN 6200 PARTICLE INSPECTION SYSTEM consisting of:- Model: 6200 Surfscan- Particle Inspection System- Max Wafer Capable: 8”/200mm- System configured for 8“/200mm wafers- Defect Sensitivity: 0.12um...
Decatur, GA - Trusted Seller
KLA-Tencor AIT I Patterned Surface Defect Inspection System consisting
used
- Manufacturer: KLA-Tencor
- Model: AIT I
KLA-TENCOR AIT I PATTERNED SURFACE DEFECT INSPECTION SYSTEM consisting of: - Model: AIT I Main System- KLA-Tencor AIT I Mainframe- Currently Configured for 6"/150mm & 8"/200mm Wafers- Double Darkfield Inspection ...
Decatur, GA Rudolph NSX-95 Test & Measurement (semiconductors)
used
- Manufacturer: Rudolph
- Model: NSX-95
Good condition Rudolph NSX-95 Test & Measurement (semiconductors)s. Located in USA and other countries. Click request price for more information.
USA