Semiconductors » Test & Measurement (semiconductors)

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Used automation

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    2022 Viscom X7056-II

    2022 Viscom X7056-II

    • Manufacturer: Viscom

    Viscom X7056-II X-Ray AOI Line (2021) Comprising: 3D Automated Optical and X-ray Inspection VISCOM AG – X7056-II Transport Conveyor ASYS Automation Systems – TRM 03 Transportmodul: Lenght:1590 mm Year of Manufact...

    Radolfzell, Germany
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    Seamark X1000 X-Ray SMD Counter

    Seamark X1000 X-Ray SMD Counter

      X1000 X-ray SMD Counter: 7-15 inch reels, Loose or tightly wound components scanning Support Automatic counting components on reels, belts, ESD bags and in JEDEC trays Automated counting of unknown components Fas...

      Veenendaal, Netherlands
    • SEICA PILOT 4D V8, vintage

      SEICA PILOT 4D V8, vintage 2016, flying probe

      • Manufacturer: SEICA

      Operational condition and available for delivery! Fully automated with a feeder system for entire magazine. *Look at the additional options spec shown on picture Additional pictures and information upon request!

      Europe
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      AOI Systems Scanner based First

      AOI Systems Scanner based First Article Inspector

        First Article Inspection -The FA-Inspector is a scanner-based optical inspection system used to automate first article inspections and subsequent production inspection tasks without programming. The FA-Inspector ...

        Veenendaal, Netherlands
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        AOI Systems Scanner based First

        AOI Systems Scanner based First Article Inspector

          First Article Inspection -The FA-Inspector is a scanner-based optical inspection system used to automate first article inspections and subsequent production inspection tasks without programming. The FA-Inspector ...

          Veenendaal, Netherlands
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          2007 Nordson Matrix MX3600

          2007 Nordson Matrix MX3600

          • Manufacturer: Nordson

          Röntgen/hi-sp Autom Inline X-ray Insp sys Condition of machinery: Awaiting Inspection

          Budapest, Hungary
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          2011 Orbotech Ultra Discovery VM

          2011 Orbotech Ultra Discovery VM

          • Manufacturer: Orbotech
          • Model: Discovery

          Vintage 2011 Condition: good CE marked - High throughput and superior detection with minimal number of false calls - Especially designed for inspection of the finest lines down to 10μm - Quick set-up even for...

          Europe
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          FAI1095 Automatic First Article Inspection

          FAI1095 Automatic First Article Inspection Machine

            Measurement Display Range：R: 0.01m ohms ~ 99.9999M ohms L: 0.01nH ~ 9999.9H C: 0.00001pF ~ 9.9999F The First Article Inspection Machine, known as the FAI1095, represents a paradigm shift in PCBA testing, transcen...

            Shenzhen, China
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            TSK UF3000

            • Manufacturer: Accretech - Tokyo Seimitsu - TSK
            • Model: UF3000

            TSK UF3000 was developed to be the de facto standard model for the semiconductor testing process that accurately meets these needs. It is a fully automatic, ultra-high function probing machine that meets the tota...

            Sherwood, OR
          • COMET VXP 160.15, vintage 2006,

            COMET VXP 160.15, vintage 2006, X ray device

            • Manufacturer: Comet

            Machine sold as is. COMET VXP-160.15 is an advanced x-ray imaging equipment designed for medical and industrial applications. It utilizes high energy x-rays to create images of internal objects such as bones, or...

            Estonia
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            Leica INM20

            • Manufacturer: Leica

            Leica INM20 LEICA AUTOMATED WAFER INSPECTION MICROSCOPE Automated Wafer Inspection Microscope Brightfield/Darkfield, DIC, With LEP motorized wafer transport system

            Bree, Ireland
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            Nikon Automated Wafer Inspection

            • Manufacturer: Nikon

            Asia
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            Leica POLYLITE 88

            • Manufacturer: Leica

            Leica POLYLITE 88 LEICA/REICHERT WAFER INSPECTION MICROSCOPE Automated Wafer Inspection Microscope Brightfield/Darkfield With LEP motorized wafer transport system

            Bree, Ireland
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            Leica POLYLITE 88

            • Manufacturer: Leica

            Leica POLYLITE 88 LEICA/REICHERT WAFER INSPECTION MICROSCOPE Automated Wafer Inspection Microscope Brightfield/Darkfield/DIC With LEP motorized wafer transport system

            Bree, Ireland
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            SELA EM2

            • Manufacturer: Unknown

            SELA EM2 Automated TEM and SEM sample preparation system – SELA EM2 A dedicated, automated, timesaving, and user-friendly system that enables a total solution for TEM/STEM and SEM sample preparation for both cros...

            Bree, Ireland
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