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Used Test & Measurement (Semiconductors)

  • Trusted Seller
    Signatone CM460-22

    Signatone CM460-22

    • Manufacturer: Signatone
    • Model: CM-460-22

    Signatone CM460-22 semiautomatic probe station 150mm wafer chuck probe card holder joystick controller XY linear motor drive for chuck manual XY microscope translation Mitutoyo FS60 microscope with fiber l...

    United States
  • Trusted Seller
    Signatone CM-465-22

    Signatone CM-465-22

    • Manufacturer: Signatone
    • Model: CM-465-22

    Status of Equipment: De-installed Process Type: Wafer Probes Signatone CM460-22 semiautomatic probe station which includes / SIGNATONE WL210 / Vibration Isolation Table /Monitor Mount, KEITHLEY 2636B SOURCE MET...

    United States
  • Trusted Seller
    PLASMOS SD 4003 200mm Automated

    PLASMOS SD 4003 200mm Automated Ellipsometer AF-750 Lang MCC 12 + MP 4000 As-Is

    • Manufacturer: Plasmos

    - Part No: SD 4003 - Model No: SD 4000 - Configured for wafers up to 200mm - SD Version: 6.25A - Input: 230V, 50/60Hz - Sold As-Is Included Components - System Control Computer - Lang Controller Part No: MCC 12...

    United States
  • Trusted Seller
    RUDOLPH FE-VII-D, Focus Ellipsometer

    RUDOLPH FE-VII-D, Focus Ellipsometer

    • Manufacturer: Rudolph

    RUDOLPH FE VII D is an ellipsometer designed for the characterization of thin films and surfaces. It uses both broadband and monochromatic illumination to measure the degree of polarization of back-reflected ligh...

    United States
  • Trusted Seller
    2012 Multitest MT 2168

    2012 Multitest MT 2168

    • Manufacturer: Multitest
    • Model: MT2168

    Vintage 2012 Condition: like new Test Tool from multitest was rarely used for development project ABC - Excellent Condition (Basically new) - Complete (no missing parts) - No Damages - Fully testing COOLiR2...

    United States
  • Trusted Seller
    Advantest T5771 ES

    Advantest T5771 ES

    • Manufacturer: Advantest
    • Model: T5771ES

    Advantest T5771 ES Flash Memory Tester Flash Memory Tester A low-cost and high-throughput test system used in the front-end testing of flash memory that is capable of testing 128 devices simultaneously. The T5...

    United States
  • Trusted Seller
    KLA-Tencor Corp. Surfscan SP2.5+

    KLA-Tencor Corp. Surfscan SP2.5+

    • Manufacturer: KLA-Tencor
    • Model: Surfscan SP2

    Particle Measurement Metrology Equipment Currently Configured for: 300mm · Defect Inspection · Two Load Ports · SECS/GEM Capability · Integration to Klarity/UDB · Auto DSA · High resolution 3D imaging of ...

    United States
  • Trusted Seller
    Zeiss LM100

    Zeiss LM100

    • Manufacturer: Zeiss
    • Model: LM100

    Zeiss LM100 Microscope Large Panel Inspection Tool Zeiss large panel inspection and CD (critical dimension measurement) tool with laser autofocus Merzhauser motorized xy stage with 550mm x 550mm travel (21.6"x2...

    United States
  • Trusted Seller
    2004 TEL P12XL

    2004 TEL P12XL

    • Manufacturer: Tokyo Electron - TEL
    • Model: P-12XL

    TEL, P12XL Prober, 300mm, TEL P12XL Prober single foup VIP3A Tool Status Disconnected Wafer Size 300 mm Fab Section Test Asset Description TEL P12XL Prober single foup VIP3A Software Version Rby00-R016.02U1 ...

    United States
  • Trusted Seller
    2012 Advantest T6373 ND3

    2012 Advantest T6373 ND3

    • Manufacturer: Advantest
    • Model: T6373 ND3

    Inspection Available Yes Description Working Condition ND3 Test Systems. (2) Available Condition Excellent PIN CONFIGURATION MAINFRAME : 1 ‐ 256 TH1 [CTD ] : 1 ‐ 256 LCD : 1 ‐ 2048 RVS : 1 ‐ 64 DPU CONFIG...

    United States
  • Trusted Seller
    Advantest T2000 LS

    Advantest T2000 LS

    • Manufacturer: Advantest
    • Model: T2000LS

    T2000LS with (8) BPS-034449X03 800DM’s | (2) BPS-035792 DPS150A | (1) BPS-034491 PMU32 Condition Good Working Condition/Off-Line Configuration T2000LS with (8) BPS-034449X03 800DM’s | (2) BPS-035792 DPS150A | ...

    United States
  • Trusted Seller
    2007 KLA Candela CS 20

    2007 KLA Candela CS 20 Wafer Inspection

    • Manufacturer: KLA-Tencor

    KLA Candela CS 20 Wafer Inspection - 1 Phase - 50/60 Hz - 115 V 2007 Vintage

    United States
  • Trusted Seller
    Veeco / Digital Instruments Dimension

    Veeco / Digital Instruments Dimension 3100 Atomic Force Microscope (AFM)

    • Manufacturer: Veeco - Sloan
    • Model: Dimension 3100

    - Comes with all necessary components Including: - Upgraded AFM Control Computer with NanoScope V 6.13 Control Software - NanoScope Analysis V 1.5 - Dual 22" Dell Flatscreen Monitors - Digital instruments Tr...

    United States
  • Trusted Seller
    2004 KLA- Tencor Surfscan SP

    2004 KLA- Tencor Surfscan SP 1 DLS Unpatterened Surface Inspection

    • Manufacturer: KLA-Tencor
    • Model: Surfscan SP1

    - Refurbished - 0.050 um Defect Sensitivity on Polished Bare Silicon - Enhanced Rough Film Sensitivity - Already upgraded with ENH SS laser - Defect Map and Histogram with Zoom - RTDC (Real Time Defect Class...

    United States
  • Trusted Seller
    NIKON NWL860-TMB-SP

    NIKON NWL860-TMB-SP

    • Manufacturer: Nikon
    • Model: NWL860

    Nikon Eclipse L200 microscope with 5/10/20/50/100 LU Plan BD objectives for brightfield and darkfield Nikon NWL-860-TMB wafer loader with macro and backside inspection modes Nikon 8x8 shuttle stage Alignment p...

    United States
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    Agilent - Keysight 16058A Test & Measurement (semiconductors)

    • Manufacturer: Agilent - Keysight
    • Model: 16058A

    Good condition Agilent - Keysight 16058A Test & Measurement (semiconductors)s available between 1990 and 1995 years. Located in USA and other countries. Click request price for more information.

    USA
4647484950