Used scanning electron microscope

Scanning Probe Microscopes

At the heart of every measurement instrument, nanopositioning stages based on our patented slip-stick principle provide several degrees of freedom over several millimeters, with a sub-nm precision. The clever mec...

Jeol JSM 7000F SEM Field Emission Scanning Electron Microscope Nice

• Manufacturer: Jeol
• Model: JSM-7000

Jeol JSM 7000F SEM Field Emission Scanning Electron Microscope Nice Have two warehouses full of used equipment and tooling, and always getting new inventory.

SymPhoTime 64

Powerful 64bit TTTR data acquisition and analysis software Point, 2D, and 3D data acquisition with online preview of FLIM, FCS, time-traces, or TCSPC histograms FLIM, fast FLIM, FLIM-FRET FCS, FCCS, FLCS, PIE-FCS...

NCS Tungsten Filament Scanning Electron Microscope SE-800

• Manufacturer: NCS

Instrument name: Tungsten Filament Scanning Electron Microscope SE-800 | Manufacturer: nanobundle | Origin: Beijing, China

NCS field-emission scanning electron microscope FE-1050T

• Manufacturer: NCS

Instrument name: Field Emission Scanning Electron Microscope FE-1050T | Manufacturer: nanobundle | Origin: Beijing, China

2016 COXEM, CX-200, SEM (Scanning Electron Microscope)

• Manufacturer: COXEM

Magnification 15~300,000x, 770x880x1500mm, 350kg - DESCRIPTION: Magnification 15~300,000x, 770x880x1500mm, 350kg - CONDITION: As-is

NCS Low-Voltage Ultrafine Field Emission Scanning Electron Microscope FE-2050T

• Manufacturer: NCS

Product Features Key Technology Imaging Diagram Instrument model: FE-2050T | Manufacturer: nanobundle | Origin: Beijing, China

Hitachi, S-3000H, SEM (Scanning Electron Microscope)

• Manufacturer: Hitachi
• Model: S-3000H

Resolution 3.5nm, Specimens size 150mm diameter - DESCRIPTION: Resolution 3.5nm, Specimens size 150mm diameter - VINTAGE: Unknown - CONDITION: As-is

Ideal Vacuum PlasmaVAC P50W Plasma Cleaning & Decontamination System, with Remote Plasma Source, is Commonly Used For SEM, TEM, ALD, & PVD Sample and Substrate Preparation

Description Ideal Vacuum PlasmaVAC P50W Plasma Cleaning & Decontamination System, with Remote Plasma Source Commonly Used for SEM, TEM, ALD, & PVD Sample and Substrate Preparation. Our Ideal Vacuum PlasmaVAC P50W...

Hitachi Scanning Electron Microscope

• Manufacturer: Hitachi

1997 formula S-2150

NCS Field Emission Scanning Electron Microscope FE-1050 Series

• Manufacturer: NCS

Instrument name: Field Emission Scanning Electron Microscope FE-1050 Series | Instrument model: FE-1050 Series | Manufacturer: nanobundle | Origin: Beijing, China

Ultrasonic Scanning Microscope T100

I. Introduction: 1. Ultrasonic scanning microscope detection technology features fast inspection speed and no damage to workpieces, widely used in medical, petroleum, automotive, semiconductor, integrated circuit...

Ultrasonic Scanning Microscope T300

1. Introduction: 1. The ultrasonic scanning microscope detection technology features fast detection speed and no damage to the workpiece, and is widely used in medical, oil, automotive, semiconductors, integrated...

Ultrasonic scanning microscope Laes1200

1) Introduction: 1. Ultrasonic Scanning Microscope (SAM) is a nondestructive testing imaging device that uses ultrasonic waves as the propagation medium. 2. Using high-frequency ultrasound to inspect various semi...