Used Test & Measurement (Semiconductors)

Rudolph / August NSX-105 Automated Wafer, Die & Bump Inspection

• Manufacturer: Rudolph
• Model: NSX-105

Rudolph / August NSX-105 Automated Wafer, Die & Bump Inspection consisting of: - Model: NSX-105- Automated Wafer, Die & Bump Inspection- 4”/6”/8” Wafer Handler- Ultraport top plate- Objectives: 1, 2, 5, 20x - PC...

Rudolph NSX-115 Advanced Wafer Inspection

• Manufacturer: Rudolph
• Model: NSX-115

Rudolph NSX-115 Advanced Wafer Inspection consisting of: - Model: NSX-115- Ultra port quick change top plate & film frame quick change top plate- Ultra port 50/50: - Loadport A is for film frame for 6&8” filmfr...

KLA-Tencor Surfscan 6400 Particle Inspection System

• Manufacturer: KLA-Tencor
• Model: Surfscan 6400

KLA-TENCOR SURFSCAN 6400 Particle NSPECTION SYSTEMconsisting of:- Model: Surfscan 6400- Particle Inspection System- System can handle up to 200mm capable- Cassette Handling: Single puck handling from single casse...

Dage XD7500VR X-ray Inspection System

• Manufacturer: Nordson DAGE
• Model: XD7500VR

Dage XD7500VR X-ray Inspection System DOM: 2008 Standalone Open Tube 160kV 70 degree Oblique view 1,500 X Geometric Magnification (7,000 X system magnification) Easy Collision-Free, High Magnification Insp...

UNITED ELECTRIC E100-2BSB TEMPERATURE SWITCH ($300 OBO)

“USED, EXCELLENT” UNITED ELECTRIC E100-2BSB TEMPERATURE SWITCH 30-250 DEG F 0-120 DEG C 15A 480 VAC REMOTE MOUNT ***Local deliveries available, simply message us before purchasing so we can properly adjust the li...

KLA-Tencor Surfscan 6420 Particle Inspection System

• Manufacturer: KLA-Tencor
• Model: Surfscan 6420

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Nordson / Dage Series 4000 Bond Tester

• Manufacturer: Nordson DAGE
• Model: 4000

Nordson / Dage Series 4000 Bond Tester consisting of: - Leica S6 Microscope- PC & Monitor- Mouse and Keyboard- Ion Gun Choice of One Below Included with System: - BS250R - BS5KGR - CBP1KG(Additional Available for...

KLA Tencor Surfscan 6200 Particle Inspection System

• Manufacturer: KLA-Tencor
• Model: Surfscan 6200

KLA-TENCOR SURFSCAN 6200 PARTICLE INSPECTION SYSTEM consisting of:- Model: 6200 Surfscan- Particle Inspection System- Max Wafer Capable: 8”/200mm- System configured for 8“/200mm wafers- Defect Sensitivity: 0.12um...

KLA-Tencor AIT I Patterned Surface Defect Inspection System consisting

• Manufacturer: KLA-Tencor
• Model: AIT I

KLA-TENCOR AIT I PATTERNED SURFACE DEFECT INSPECTION SYSTEM consisting of: - Model: AIT I Main System- KLA-Tencor AIT I Mainframe- Currently Configured for 6"/150mm & 8"/200mm Wafers- Double Darkfield Inspection ...

KLA-Tencor AIT I Patterned Surface Defect Inspection System

• Manufacturer: KLA-Tencor
• Model: AIT I

KLA-TENCOR AIT I PATTERNED SURFACE DEFECT INSPECTION SYSTEM consisting of: - Model: AIT I Main System- KLA-Tencor AIT I Mainframe- Currently Configured for 6"/150mm & 8"/200mm Wafers- Double Darkfield Inspection ...

LTX 974-0248-00 Device Interface Board

1 in stock The LTX 974-0248-00 Device Interface Board is a specialized piece of equipment designed for use in semiconductor testing and assembly. Manufactured by LTX, this interface board allows for efficient com...

Tokyo Electron 1105-401424-31 GUIDE TO Quartz #K-1812

• Manufacturer: Tokyo Electron - TEL

National Instruments 779647-31

• Manufacturer: National Instruments

779647-31 | PXI-4130, -20 V to 20 V, 40 W, PXI Source Measure Unit