2010 Park Systems, XE-150, AFM (Atomic Force Microscope)
used
- Manufacturer: Park Systems
XY Scan Range 100x100µm2, Z Scan Range 12µm, Noise Level 0.05nm (Max) - DESCRIPTION: XY Scan Range 100x100µm2, Z Scan Range 12µm, Noise Level 0.05nm (Max) - CONDITION: Working
Suwon-si, South Korea