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Used dynamic testing system in New York, USA

  • 2012 Ismeca NX32

    2012 Ismeca NX32

    • Manufacturer: Ismeca

    12-pin Ambient Accelerometer Test System with Dynamic, Static & Taper Stations

    New York, USA
  • 2013 Ismeca NX32

    2013 Ismeca NX32

    • Manufacturer: Ismeca

    Ambient Accelerometer Test System with Taper and 16 Static 12-pin Test Sites plus 1 Dynamic Flip Audit Test Station (16+1)

    New York, USA