2009 FEI Nova NanoSEM 450
- Manufacturer: FEI
The FEI Nano Nova 430 FEG-SEM installed in 2009 is configured for high-resolution and analytical imaging of various materials. The instrument combines a field emission electron source, oil-free vacuum system, SE,...
Cleveland, OH
FEI thermo fisher XL30 FEG SEM electron microscope
- Manufacturer: FEI
- Model: XL30
FEI xl30 Electron microscope with FEG source, EDS for element identification, Backscatter electron detector (BSE) and UHR immersion final lens for excellent hi res low kV imaging. The xl 30 has a 50mm stage that ...
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