
SBT Online Ultrasonic Scanning Microscope
- Manufacturer: SBT
Applications IGBT and SiC module layering inspection Semiconductor chip packaging layering inspection Equipment Advantages Automatic or manual sample loading and unloading Automatic bubble removal Automatic ultra...
Shanghai, China
SBT Semi-Automatic Ultrasonic Scanning Microscope
- Manufacturer: SBT
Applications IGBT and SiC module layering inspection Semiconductor chip packaging layering inspection Equipment Advantages Features: Equipped with dual-sided automatic carrier water immersion mechanism Customizab...
Shanghai, China- Trusted Seller

FEI 4035 272 35991
- Manufacturer: FEI
Suppressor for FIB systems using FEI Sidewinder or Tomahawk FIB column, such as: Certus / CLM ExSolve Helios Scios Strata 400 V600. We recommend a new suppressor every or every other time a new 69Ga LMIS i...
China - Trusted Seller

FEI 4035 273 14911
- Manufacturer: FEI
Automatic Aperture Mechanism (AAM) strips for FEI Sidewinder and Tomahawk FIB columns, standard configuration for 15 different beam currents. Aperture sizes provide 30kV beam currents of: 1.1pA 40pA 430pA 4100p...
China - Trusted Seller

FEI 16830
- Manufacturer: FEI
Guaranteed to be isotopically pure, our 69Ga Liquid Metal Ion Source (LMIS) is proven for use with FIB and FIB-SEM systems with FEI Phoenix G4, FEI Tomahawk G3 or FEI Sidewinder G2 FIB columns, such as: Certus /...
China - Trusted Seller

850-610-G2
- Manufacturer: FT
The Inficon 850 series cold cathode gauge was used in a broad variety of vacuum systems beginning approximately 1990. This item is new and works great as a replacement for the original CCG in your vintage SEM, FI...
China - Trusted Seller

14040-11-0
- Manufacturer: FT
Tungsten deposition material for use in all FEI FIB and FIB/SEM systems using FEI Gas Injection Systems. This material is commonly used to deposit tungsten in FIB, SEM and laser systems. Contact us for larger qu...
China - Trusted Seller

FEI 1058129
- Manufacturer: FEI
Extractor assembly for systems using the FEI Phoenix / G4 FIB columns, such as: ExSolve G4 Helios G4 Scios G4 V600 G4 Consists of assembled extractor cap, beam acceptance aperture, sputter shield and housing...
China - Trusted Seller
China - Trusted Seller

94442-22-5
- Manufacturer: FT
Platinum deposition material for use in all FEI, Zeiss and other FIB and FIB/SEM systems using gas injection systems. This material is commonly used to deposit platinum in FIB, SEM and laser systems. Contact us ...
China - Trusted Seller

FEI 4035 272 35971
- Manufacturer: FEI
Extractor assembly for systems using FEI Sidewinder FIB column with max. 20nA beam current, such as: Certus / CLM Scios Strata 400 V600 Consists of assembled extractor cap, beam acceptance aperture, sputter ...
China - Trusted Seller

FEI 17135
- Manufacturer: FEI
Gallium Liquid Metal Ion Source (LMIS) for early generation FEI FIB and FIB-SEM systems, such as: FIB200 series, FIB600 series and FIB 800 series and other systems with the Pre-lens FIB column DB235 / Strata, D...
China - Trusted Seller

Extractor assembly/cap
- Manufacturer: FT
Extractor assembly, aka Quick change kit, for FEI Magnum FIB column with 20nA maximum beam current. This item is a direct replacement for FEI p/n 24115. Each fully assembled extractor consists of: extractor ca...
China - Trusted Seller

Suppressor used in the FEI Magnum
- Manufacturer: FEI
Suppressor used in the FEI Magnum FIB column. A new suppressor is recommended with every or every other LMIS change. This item is a direct replacement for FEI p/n 24152.
China - Trusted Seller

850-610-G1
- Manufacturer: FT
The Inficon 850 series cold cathode gauge was used in a broad variety of vacuum systems beginning approximately 1990. This CCG rebuild kit works with models 850-610-G1 thru -G3, and is typically used when the ga...
China

