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About the Jeol JSM
The Jeol JSM series are versatile scanning electron microscopes designed for high‑resolution imaging and materials analysis. Built for labs and industrial inspection, the JSM line offers flexible detector options, stable optics and user‑friendly operation for research, failure analysis and quality control.
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2011 JEOL JSM 7001F Schottky Emission SEM
- Manufacturer: Jeol
- Model: JSM
Resolution: 1.2 nm at 30 kV, 3.0 nm at 1.0 kV Accelerating Voltage: 0.5 to 30 kV Specimen Stage: Mechanically eucentric at all WDs Imaging modes: SE, BEI to E/T detector OS: Windows 10 External Detectors: None
United Kingdom 
Jeol JSM Microscope
- Manufacturer: Jeol
- Model: JSM
Good condition Jeol JSM Microscopes manufactured in 2009. Located in Ireland and other countries. Click request price for more information.
Ireland

