Search By Model

Building Filters

About the Jeol JSM

The Jeol JSM series are versatile scanning electron microscopes designed for high‑resolution imaging and materials analysis. Built for labs and industrial inspection, the JSM line offers flexible detector options, stable optics and user‑friendly operation for research, failure analysis and quality control.

Related Events

Live Now

Trividia Health: Complete Diabetic Test Strip Manufacturing Line

by Federal Equipment - Auctions

Online
Ends Feb 17th, 14:00 CST
View event