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Jeol JEM 2010 Electron Microscope
- Manufacturer: Jeol
– LaB6 Gun, aligned at 200 keV and 120 KeV – The pole piece is an ARP. Tilt angle alloed ± 30° with a standard JEOL older – With a camera Gatan Erlangshen (wide angle port) and without holders or detector
Europe 
2018 Jeol JSM-IT200LV InTouchScope Scanning Electron Microscope
- Manufacturer: Jeol
- Model: JSM
Jeol JSM-IT200LV InTouchScope Scanning Electron Microscope IXRF EDS detector included DOM: 2018 High resolution imaging in HV/LV/SE/BSE Zeromag-mode for intuitive transition from light-optic to SEM image Che...
United States
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