- Trusted Seller
Anelva 912-7165 Ion Ultra High Vacuum Pump JEOL JSM-6300F SEM Working Surplus
- Manufacturer: Jeol
- Model: JSM
“Removed from a JEOL JSM-6300F SEM Scanning Electron Microscope System” Anelva 912-7165 Ion Ultra High Vacuum Pump JEOL JSM-6300F SEM Working Surplus Removed from a JEOL JSM-6300F SEM Scanning Electron Microscope...
$904 USDAlbuquerque, NM - Trusted Seller
JEOL JSM-6300F Ion Vacuum Pump Magnet Assembly Wafer Defect Review SEM Working
- Manufacturer: Jeol
- Model: JSM
“Removed from a JEOL JSM-6300F SEM Scanning Electron Microscope System” JEOL JSM-6300F Ion Vacuum Pump Magnet Assembly Wafer Defect Review SEM Working Inventory # 21078 Removed from a JEOL JSM-6300F SEM Scanning ...
$805 USDAlbuquerque, NM - Trusted Seller
JEOL AP002109-00 Processor PCB Card JSM-6300F SEM Working Surplus
- Manufacturer: Jeol
- Model: JSM
“Removed from a JEOL JSM-6300F SEM Scanning Electron Microscope System.” JEOL AP002109-00 Processor PCB Card JSM-6300F SEM Working Surplus Inventory # 21147 Removed from a JEOL JSM-6300F SEM Scanning Electron Mic...
$1,006 USDAlbuquerque, NM - Trusted Seller
JEOL JEM-2100F Transmission Electron Microscope System (2009) TEM Lab
- Manufacturer: Jeol
JEOL JEM-2100F Transmission Electron Microscope System (2009) This system is sold on behalf of a client where it is surplus to requirements. This system is in complete working order, and in good cosmetic conditio...
- Trusted Seller
JEOL JEM-2100F Transmission Electron Microscope System (2009) TEM Lab
- Manufacturer: Jeol
JEOL JEM-2100F Transmission Electron Microscope System (2009) This system is sold on behalf of a client where it is surplus to requirements. This system is in complete working order, and in good cosmetic conditio...
- Trusted Seller
JEOL 10x Binocular Microscope Assembly JEM-2010F TEM Microscopy System Used
- Manufacturer: Jeol
“Removed from a JEOL JEM-2010F TEM Transmission Electron Microscopy System.” JEOL 10x Binocular Microscope Assembly JEM-2010F TEM Microscopy System Used Inventory # 15339 This JEOL 10x Binocular Microscope is use...
$608 USDAlbuquerque, NM - Trusted Seller
JEOL JSM-6300F SEM Scanning Electron Microscope Column Assembly Working Surplus
- Manufacturer: Jeol
- Model: JSM
“Removed from a JEOL JSM-6300F SEM Scanning Electron Microscope System. The unit has some scuffs to the paint (see photos).” JEOL JSM-6300F SEM Scanning Electron Microscope Column Assembly Working Spare Removed f...
$2,803 USDAlbuquerque, NM - Trusted Seller
JEOL EM-07130 Microscope Controller fasTEM Panel TEM JEM-2010F Working
- Manufacturer: Jeol
“Removed from a JEOL JEM-2010F TEM Transmission Electron Microscopy System.” JEOL EM-07130 Microscope Controller fasTEM Panel TEM JEM-2010F Working Removed from a JEOL JEM-2010F TEM Transmission Electron Microsco...
$608 USDAlbuquerque, NM - Trusted Seller
JEOL EM-24015BU TEM Electron Microscope Optical Lens Assembly JEM-2010F Used
- Manufacturer: Jeol
“Removed from a JEOL JEM-2010F TEM Transmission Electron Microscopy System.” JEOL EM-24015BU TEM Electron Microscope Optical Lens Assembly JEM-2010F Used Inventory # 15343 This JEOL EM-24015BU is used working sur...
$2,008 USDAlbuquerque, NM - Trusted Seller
JEOL Jeol JSM-5910LV SEM Scanning Electron Microscope Lab
- Manufacturer: Jeol
- Model: JSM
This Jeol JSM-5910LV SEM Scanning Electron Microscope was removed from a university lab where it was surplus to requirements. The system has not been tested. The Oxford dewar has come away from the unit and dent...
United States - Trusted Seller
2010 JEOL 2100 Probe-Corrected Analytical Electron Microscope
- Manufacturer: Jeol
- Applications: Aberration-corrected STEM imaging for atomic structures, Elemental mapping with EDS, EELS/EFTEM for elemental mapping and thickness measurements - Acceleration Voltage: 100 and 200 kV - Filament...
United States - Trusted Seller
2010 JEOL 2100 Probe-Corrected Analytical Electron Microscope
- Manufacturer: Jeol
Jeol 2100 Probe-Corrected Analytical Electron Microscope - Applications: Aberration-corrected STEM imaging for atomic structures, Elemental mapping with EDS, EELS/EFTEM for elemental mapping and thickness measur...
United States - Trusted Seller
JEOL JSM-6300F SEM Scanning Electron Microscope Column Assembly Working Surplus
- Manufacturer: Jeol
- Model: JSM
- Model No: JSM-6300F Column - Removed from a JEOL JSM-6300F SEM Scanning Electron Microscope System This JEOL JSM-6300F SEM Scanning Electron Microscope Column Assembly is used working surplus. The unit has som...
United States - Trusted Seller
JEOL JSM-IC25S SCANNING MICROSCOPE CONTROL
- Manufacturer: Jeol
- Model: JSM
Unit removed from Joel JEM-100CX Electron Microscope. System last used at a major Alabama University. We are selling for parts because we are unable to test
$999 USDEl Paso, TX - Trusted Seller
GW Electronics Type 43 Infrared Chamberscope JEOL JSM-6300/6400F Working Surplus
- Manufacturer: Jeol
- Model: JSM-6400
GW Electronics Type 43 Infrared Chamberscope JEOL JSM-6300/6400F Working Surplus Inventory # 21122 For use with the JEOL JSM-6300/6400F SEM Scanning Electron Microscope System This GW Electronics Type 43 Infrared...
$1,006 USDAlbuquerque, NM
Tip: Enter manufacturer, model or keyword
