- Trusted Seller
KLA Tencor Surfscan 6200 Particle Inspection System
- Manufacturer: KLA-Tencor
- Model: Surfscan 6200
KLA-TENCOR SURFSCAN 6200 PARTICLE INSPECTION SYSTEM consisting of:- Model: 6200 Surfscan- Particle Inspection System- Max Wafer Capable: 8”/200mm- System configured for 8“/200mm wafers- Defect Sensitivity: 0.12um...
Decatur, GA - Trusted Seller
KLA-Tencor Surfscan SP1 DLS Unpatterned Surface Inspection System
- Manufacturer: KLA-Tencor
- Model: Surfscan SP1
KLA-TENCOR SURFSCAN SP1 DLS UNPATTERNED SURFACE INSPECTIONSYSTEM consisting of:- Model: SP1 DLS with 300mm Single FOUP/FIMS Handler (other handlers available)- Currently Configured for 200/300mm Wafers - Unpatter...
Decatur, GA - Trusted Seller
KLA-Tencor Surfscan 5500 Inspection System
- Manufacturer: KLA-Tencor
- Model: Surfscan 5500
KLA-Tencor Surfscan 5500 Inspection System consisting of:- Model 5500 Main System- Can handle from 2" up to 8"/200mm wafers- Submicron sensitivity, detects 0.2 micron particles- Surface haze detected as low as 0....
Decatur, GA - Trusted Seller
2004 KLA- Tencor Surfscan SP 1 DLS Unpatterened Surface Inspection
- Manufacturer: KLA-Tencor
- Model: Surfscan SP1
- Refurbished - 0.050 um Defect Sensitivity on Polished Bare Silicon - Enhanced Rough Film Sensitivity - Already upgraded with ENH SS laser - Defect Map and Histogram with Zoom - RTDC (Real Time Defect Class...
United States - Trusted Seller
KLA-TENCOR Surfscan 5500
- Manufacturer: KLA-Tencor
- Model: Surfscan 5500
- Model 5500 Main System - Can handle from 2" up to 8"/200mm wafers - Submicron sensitivity, detects 0.2 micron particles - Surface haze detected as low as 0.3 ppm. - Handles high scattering surfaces such as ...
United States 
KLA-TENCOR SURFSCAN 6220 (SFS 6220)
- Manufacturer: KLA-Tencor
- Model: Surfscan 6220
KLA-Tencor Surfscan 6220 (SFS 6220) Wafer Surface Contamination Analysis System The SFS 6220 tool is used for wafer surface contamination analysis of unpatterned semiconductor wafers. System is calibrated, tes...
- Trusted Seller
KLA TENCOR auto RS-55TC
- Manufacturer: KLA-Tencor
- Accommodates all Wafer Sizes from 50mm – 200mm - 5 Megaohm/sq Measurement Range - Typical Measurement Time: 5 – 4.5 Seconds per Test Site - <0.2% (1 sigma) Measurement Repeatability - Thermal Chuck Temperature ...
United States - Trusted Seller
KLA-Tencor Auto RS-55tc Resistivity Test Tool
- Manufacturer: KLA-Tencor
- Accommodates all Wafer Sizes from 50mm – 200mm - 5 Megaohm/sq Measurement Range - Typical Measurement Time: 5 – 4.5 Seconds per Test Site - <0.2% (1 sigma) Measurement Repeatability - Thermal Chuck Temperature ...
United States 
2012 KLA TENCOR Candeal 8620
- Manufacturer: KLA-Tencor
- Model: Candela 8620
KLA-Tencor Candela 8620 Optical Surface Analyzer (OSA) is a laser-based inspection system for semiconductor and optoelectronic wafers. It is fully automated with integrated wafer handling for cassette-to-cassette...
Cheonan-si, South Korea
2011 KLA TENCOR Candela 8620
- Manufacturer: KLA-Tencor
- Model: Candela 8620
KLA-Tencor Candela 8620 Optical Surface Analyzer (OSA) is a laser-based inspection system for semiconductor and optoelectronic wafers. It is fully automated with integrated wafer handling for cassette-to-cassette...
Cheonan-si, South Korea
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