- Trusted Seller
KLA Tencor Surfscan 6200 Particle Inspection System
- Manufacturer: KLA-Tencor
- Model: Surfscan 6200
KLA-TENCOR SURFSCAN 6200 PARTICLE INSPECTION SYSTEM consisting of:- Model: 6200 Surfscan- Particle Inspection System- Max Wafer Capable: 8”/200mm- System configured for 8“/200mm wafers- Defect Sensitivity: 0.12um...
Decatur, GA - Trusted Seller
KLA-Tencor SP1 TBI Unpatterned Surface Inspection System
- Manufacturer: KLA-Tencor
- Model: SP1
KLA-TENCOR SP1 TBI UNPATTERNED SURFACE INSPECTION SYSTEM consisting of: - Model: SP1 TBI- Up to 300mm Wafers- Inquire about Handler Options for Various Size Wafers- Unpatterned Surface Inspection System - Wafer M...
Decatur, GA - Trusted Seller
KLA-Tencor AIT II Patterned Surface Defect Inspection System
- Manufacturer: KLA-Tencor
- Model: AIT II
KLA-TENCOR AIT II (200mm/300mm) PATTERNED SURFACE DEFECT INSPECTION SYSTEM consisting of: - Model: AIT II- Wafer Size: 200mm- 150/200mm Open Handler - Software Version 5.3.17.4- Double Darkfield Inspection Tool -...
Decatur, GA - Trusted Seller
1997 KLA-Tencor Surfscan 6220 Defect Inspection System
- Manufacturer: KLA-Tencor
- Model: Surfscan 6220
- Windows 98 SE - Software Version 4.2 - Previously refurbished in 2016 - Laser replaced in March of 2020 - Last PM performed August of 2023 1997 Vintage 2", 3", 4", 6", 8"
United States - Trusted Seller
1997 KLA Surfscan 6220
- Manufacturer: KLA-Tencor
- Model: Surfscan 6220
KLA-Tencor Equipment Model: Surfscan 6220 Type: Defect Inspection System Wafer Size: 2", 3", 4", 6", 8" Equipment Configuration: - Windows 98 SE - Software Version 4.2 - Previously refurbished in 2016 - La...
United States - Trusted Seller
KLA-Tencor Corp. Surfscan SP2.5+
- Manufacturer: KLA-Tencor
- Model: Surfscan SP2
Particle Measurement Metrology Equipment Currently Configured for: 300mm · Defect Inspection · Two Load Ports · SECS/GEM Capability · Integration to Klarity/UDB · Auto DSA · High resolution 3D imaging of ...
United States 
KLA-TENCOR SURFSCAN 6220 (SFS 6220)
- Manufacturer: KLA-Tencor
- Model: Surfscan 6220
KLA-Tencor Surfscan 6220 (SFS 6220) Wafer Surface Contamination Analysis System The SFS 6220 tool is used for wafer surface contamination analysis of unpatterned semiconductor wafers. System is calibrated, tes...
- Trusted Seller
KLA 2132 Wafer Inspection System
- Manufacturer: KLA-Tencor
Serial number W21XX639 can be sold "as is" or operational to oem specs. Deinstalled by KLA, Warehoused, barrier bagged. The system was deinstalled in september 2002 and until that date was upgraded with various h...
Trim, Ireland - Trusted Seller
1985 KLA SURFSCAN 6220
- Manufacturer: KLA-Tencor
- Model: Surfscan 6220
Wafer Size 200 mm Fab Section Metrology Tool Status Running Wafers Asset Description PCT0009(SMP-CTECH) Software Version WIN95 CIM GEM Process DO MEASUREMENT Options System NA OK Others LPT 1 OK Main Sys...
Asia - Trusted Seller
1994 KLA Surfscan 6200 Particle Counter
- Manufacturer: KLA-Tencor
- Model: Surfscan 6200
8" - 0.1 micron Defect Sensitivity (PSL STD) - 0.02 ppm Haze Sensitivity - 0.002 ppm Haze Resolution - Accuracy within 1% - XY coordinates - Lock Down accessories - Tencor approved blower assembly - 30mW ...
Asia 
1994 KLA TENCOR SFS 6200
- Manufacturer: KLA-Tencor
- Model: Surfscan 6200
*.Configuration: - Non-patterned surface Inspection System. - 0.1 micron Defect Sensitivity (PSL STD). - 0.02 ppm Haze Sensitivity. - 0.002 ppm Haze Resolution. - Accuracy within 1%. - XY coordinates. - Lock Down...
Cheonan-si, South Korea
1994 KLA TENCOR SFS 6200
- Manufacturer: KLA-Tencor
- Model: Surfscan 6200
*.Configuration: - Non-patterned surface Inspection System. - 0.1 micron Defect Sensitivity (PSL STD). - 0.02 ppm Haze Sensitivity. - 0.002 ppm Haze Resolution. - Accuracy within 1%. - XY coordinates. - Lock Down...
Cheonan-si, South Korea
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