Ultrasonic scanning microscope Laes1300
new
1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various...
Shanghai, China
Ultrasonic scanning microscope Laes820
new
1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various...
Shanghai, China
Ultrasonic scanning microscope Laes530
new
1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various...
Shanghai, China
Ultrasonic scanning microscope Laes520
new
1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various...
Shanghai, China
Ultrasonic Scanning Microscope Laes500
new
1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various...
Shanghai, China
Ultrasonic scanning microscope Laes310
new
1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various...
Shanghai, China
Ultrasonic scanning microscope Laes410
new
1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various...
Shanghai, China
Ultrasonic Scanning Microscope Laes400
new
1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various...
Shanghai, China
Ultrasonic scanning microscope Laes620
new
1. Introduction: 1. As China's semiconductor materials industry begins to promote the "Nanniwan Spirit" of domestic manufacturing and self-reliance, it is developing in the direction of refinement, high-end, cutt...
Shanghai, China
Ultrasonic scanning microscope Laes630
new
1. Introduction: 1. As China's semiconductor materials industry begins to promote the "Nanniwan Spirit" of domestic manufacturing and self-reliance, it is developing in the direction of refinement, high-end, cutt...
Shanghai, China
Ultrasonic Scanning Microscope T500
new
1. Field of application 1. Layer detection of semiconductor chip packaging 2. Software functions and features 1. Software function 2. Software features: 3. Technical parameters Six, the main configuration table F...
Shanghai, China
Ultrasonic Scanning Microscope T300
new
1. Introduction: 1. Ultrasonic scanning microscope detection technology has the characteristics of fast detection speed and no damage to workpieces. It is widely used in medical, petroleum, automobile, semiconduc...
Shanghai, China
Ultrasonic Scanning Microscope Laes1100
new
1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various...
Shanghai, China
Ultrasonic scanning microscope Laes830
new
1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various...
Shanghai, China
Ultrasonic Scanning Microscope Laes800
new
1. Introduction: 1. Ultrasonic scanning microscope detection technology has the characteristics of fast detection speed and no damage to workpieces. It is widely used in medical, petroleum, automobile, semiconduc...
Shanghai, China
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