Veeco Digital Instruments Dimension Large Sample Scanning Atomic Force microscope, LS-SPM with Nanoscope III controller and LSS large sample scanning stage in San Jose, CA, USA
Used
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Specifications
- Condition
- used
- Stock number
- 492
- Sort
- 0
- Subcategory
- Metrology
- Subcategory 2
- Atomic force microscopes
- Listing ID
- 106669892
Description
Nanoscope III SPM and controller
LSS large sample scanning stage allows imaging on samples up to 8"x8" with 6"x6" XY travel.
Samples up to 1.25" thick
Includes 850x optical microscope and fully automated stage for locating features.
optical microscope for defining the region to be scanned
acoustic enclosure,
DMLS probe
PC, flat panel monitors
Services offered by seller
This seller offers transport & logistics
$29,500 USD
Interested in this machine?
This seller has been contacted 5 times in the last week.