Veeco Digital Instruments Dimension Large Sample Scanning Atomic Force microscope, LS-SPM with Nanoscope III controller and LSS large sample scanning stage in United States
Used
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Specifications
- Condition
- used
- Stock number
- em2519
- Subcategory
- Digital instruments
- Listing ID
- 52692881
Description
Veeco Digital Instruments Dimension Large Sample Scanning Atomic Force microscope, LS-SPM with Nanoscope III controller and LSS large sample scanning stage
Nanoscope III SPM and controller
LSS large sample scanning stage allows imaging on samples up to 8"x8" with 6"x6" XY travel.
Samples up to 1.25" thick
Includes 850x optical microscope and fully automated stage for locating features.
optical microscope for defining the region to be scanned
acoustic enclosure,
DMLS probe
PC, flat panel monitors
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