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Gatan Mono CL SEM Detector Units With Princeton Pixis 100 Detector Camera Lab
- Manufacturer: Princeton
Gatan Mono CL SEM Detector Units with Princeton Pixis 100 Detector Camera This system was removed from a university laboratory where it was surplus to requirements. All units are in good cosmetic condition and po...

2009 FEI Nova NanoSEM 450
- Manufacturer: FEI
The FEI Nano Nova 430 FEG-SEM installed in 2009 is configured for high-resolution and analytical imaging of various materials. The instrument combines a field emission electron source, oil-free vacuum system, SE,...
Cleveland, OH- Trusted Seller

2010 JEOL 2100 Probe-Corrected Analytical Electron Microscope
- Manufacturer: Jeol
- Applications: Aberration-corrected STEM imaging for atomic structures, Elemental mapping with EDS, EELS/EFTEM for elemental mapping and thickness measurements - Acceleration Voltage: 100 and 200 kV - Filament...
United States - Trusted Seller

2010 JEOL 2100 Probe-Corrected Analytical Electron Microscope
- Manufacturer: Jeol
Jeol 2100 Probe-Corrected Analytical Electron Microscope - Applications: Aberration-corrected STEM imaging for atomic structures, Elemental mapping with EDS, EELS/EFTEM for elemental mapping and thickness measur...
United States - Trusted SellerAuction

Phillips CM10 Transmission Electron Microscope
- Manufacturer: Phillips
Key features: 100 kV LaB6 emitter Objective lens: resolution 0.5 nm (point), 0.34 nm (line) Magnification range: 12x - 500,000x Gatan type 626 cryo specimen holder 3.25 x 4 inch flat film camera Deinstallation co...
Gilroy, CAVisit Auction Website Jeol DEF AMP 1 PB MP003383-00 for Jeol JEM 1230 TEM Electron Microscope
- Manufacturer: Jeol
Jeol DEF AMP 1 PB MP003383-00. Unit is used and working. Pulled from a Jeol JEM 1230 TEM Electron Microscope. Was Labeled "DEF AMP1" in chassis. Info on Board: Jeol DEF AMP 1 PB MP003383-00 OK02Y292C NO: EM184400...
$899 USDFayette, AL- Trusted Seller

JEOL JEM-2100F Transmission Electron Microscope System (2009) TEM Lab
- Manufacturer: Jeol
JEOL JEM-2100F Transmission Electron Microscope System (2009) This system is sold on behalf of a client where it is surplus to requirements. This system is in complete working order, and in good cosmetic conditio...
- Trusted Seller

JEOL JEM-2100F Transmission Electron Microscope System (2009) TEM Lab
- Manufacturer: Jeol
JEOL JEM-2100F Transmission Electron Microscope System (2009) This system is sold on behalf of a client where it is surplus to requirements. This system is in complete working order, and in good cosmetic conditio...
- Trusted Seller

JEOL JEM2011 Transmission Electron Microscope TEM with CCD Camera & EDX S/R
- Manufacturer: Jeol
This JEOL JEM2011 is being sold on behalf of a university lab where it was surplus to requirements. The system is was decommissioned in August 2023. The scintillator in the Gatan Multiscan Camera is coming to the...
$4,105 USDCaerphilly, United Kingdom - Trusted Seller

Jeol JEM 2010 Electron Microscope
- Manufacturer: Jeol
– LaB6 Gun, aligned at 200 keV and 120 KeV – The pole piece is an ARP. Tilt angle alloed ± 30° with a standard JEOL older – With a camera Gatan Erlangshen (wide angle port) and without holders or detector
Europe
