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JEOL JSM 7600 F SEM
- Manufacturer: Jeol
- Model: JSM
Resolution: - 1nm guaranteed at 15kV SEM mode - 2.5nm at 1kV in SEM mode - 1.5nm at 1kV in GB mode Magnification: - SEM: x100 (at WD 25mm) to x1,000,000 (at WD 8mm) - Low-Mag LM mode: x25 to x19,000 Imagin...
United States 
2009 FEI Nova NanoSEM 450
- Manufacturer: FEI
The FEI Nano Nova 430 FEG-SEM installed in 2009 is configured for high-resolution and analytical imaging of various materials. The instrument combines a field emission electron source, oil-free vacuum system, SE,...
Cleveland, OH- Trusted Seller
Jeol Scanning Electron Microscope (PC-SEM) JSM-6490 Bruker XFlash Detector
- Manufacturer: Jeol
Jeol Type: Jeol JSM-6490 Jeol scanning electron microscope Jeol JSM-6490 scanning electron microscope (PC-SEM) Modern, high-resolution, digital scanning electron microscope with newly developed electron optics an...
- Trusted Seller

JEOL JWS-7555 scanning electron microscope
- Manufacturer: Jeol
JEOL JWS 7555 is a scanning electron microscope (SEM) that utilizes an advanced electron optical equipment, providing a high level of image performance. It is suitable for a wide range of applications, including ...
United States 
2018 Jeol JSM-IT200LV InTouchScope Scanning Electron Microscope
- Manufacturer: Jeol
- Model: JSM
Jeol JSM-IT200LV InTouchScope Scanning Electron Microscope IXRF EDS detector included DOM: 2018 High resolution imaging in HV/LV/SE/BSE Zeromag-mode for intuitive transition from light-optic to SEM image Che...
United States
