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Extractor assembly/cap
- Manufacturer: FT
Extractor assembly, aka Quick change kit, for FEI Magnum FIB column with 20nA maximum beam current. This item is a direct replacement for FEI p/n 24115. Each fully assembled extractor consists of: extractor ca...
China - Trusted Seller

FEI 1058129
- Manufacturer: FEI
Extractor assembly for systems using the FEI Phoenix / G4 FIB columns, such as: ExSolve G4 Helios G4 Scios G4 V600 G4 Consists of assembled extractor cap, beam acceptance aperture, sputter shield and housing...
China - Trusted Seller

FEI 4035 272 35971
- Manufacturer: FEI
Extractor assembly for systems using FEI Sidewinder FIB column with max. 20nA beam current, such as: Certus / CLM Scios Strata 400 V600 Consists of assembled extractor cap, beam acceptance aperture, sputter ...
China - Trusted Seller

FEI 4035 273 14911
- Manufacturer: FEI
Automatic Aperture Mechanism (AAM) strips for FEI Sidewinder and Tomahawk FIB columns, standard configuration for 15 different beam currents. Aperture sizes provide 30kV beam currents of: 1.1pA 40pA 430pA 4100p...
China 
Fluorescent Filter Cubes
Nikon offers a wide range of fluorescence filter cubes with high fluorescence acquisition efficiency to support imaging of a large variety of fluorophores and fluorescent proteins. The large product range include...
Amsterdam, Netherlands- Trusted Seller

HITACHI MODEL S-3500N SCANNING ELECTRON BEAM MICROSCOPE CRATED FOR SHIPPING
- Manufacturer: Hitachi
- Model: S-3000N
HITACHI MODEL S-3500N SCANNING ELECTRON BEAM MICROSCOPE CRATED FOR SHIPPING SEMs have been used for the evaluation of minute materials and have become an important tool for research and development in various fie...
