Microscopes » Jeol » JSM-6400

Jeol JSM-6400 Specifications

Specifications

Accelerating voltage0.5-30 kilovolt
Typical resolution5 nm
Magnification range15-300000
Chamber diameter250 mm
The above specifications are based on the 1998 model year.

Jeol JSM-6400 description

The Jeol JSM-6400 is a reliable scanning electron microscope known for stable imaging and versatile sample handling. Designed for routine materials, metallurgical and biological analysis, it delivers high-contrast images with user-friendly controls and a compact footprint ideal for labs requiring consistent SEM performance.

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