Building Filters
2006 N&K N&K 5000-CD
- Manufacturer: N&K
To be fully refurbished. Wafer size: 8" | Sell status: SELL | Tool's condition: AS-IS
Cheonan-si, South Korea
N&K OptiPrime - CD
- Manufacturer: N&K
Key Qualities of OptiPrime - CD ■ Optimized Polarized Reflectance (Rs and Rp) Data - Micro-Spot Technology ■ Can be Configured for 300 mm (12”), 200 mm (8”),and 150 mm (6”) Wafers ■ Fully Automated ■ Based on Pat...
Cheonan-si, South Korea
N&K N&K 1700
- Manufacturer: N&K
Thin Film Thickness and Trench Depth measurement. * .Available 100,125,150,200 mm by chuck change *. Pentium PC & LCD Monitor *. Windows Operating System / N&K Technology Analysis & Simulation SW *. Standard Film...
Cheonan-si, South Korea
N&K N&K 1700
- Manufacturer: N&K
*. Film Thickness and Trench profile measurement. *. Manual load Metrology system. *. Simultaneously determine thickness, n and k in the spectral range of 190-1000nm, trench profile and provide non-destructive, r...
Cheonan-si, South Korea
2006 N&K N&K 5700 CDRT
- Manufacturer: N&K
Broadband spectrometry for film thickness and trench profile measurements on photomask reticles. The n&k 5700-CDRT automated system is designed for handling 5” or 6” square masks. The n&k 5700-CDRT simultaneously...
Cheonan-si, South Korea
2004 N&K N&K 3700 RT
- Manufacturer: N&K
Broadband spectrometry for film thickness on transparent substrates, including photomask reticles. The n&k 3700-RT automated system is designed for handling 5” or 6” square masks or up to 8” square samples. These...
Cheonan-si, South Korea
2007 N&K N&K Little foot 8000 CD
- Manufacturer: N&K
Fully Automated Thin Film Metrology System for Patterned and Unpatterned Wafers Reflectance, Polarized Cognex Pattern Recognition Software Windows 7 Operating System n&k's Thin Film Characterization S/W n&k's Sta...
Cheonan-si, South Korea
2005 N&K 1700RT
- Manufacturer: N&K
Broadband spectrometry for film thickness and trench profile measurements on photomask reticles. The n&k 1700-RT is designed for handling 5” or 6” square masks. The n&k 1700-RT simultaneously determines thickness...
Cheonan-si, South Korea
2006 N&K NK5300
- Manufacturer: N&K
Fully Automated Thin Film Metrology System for Patterned and Unpatterned Wafers Cognex Pattern Recognition Software n&k's Thin Film Characterization S/W n&k's Standard Films Library Automated Wafer Loading/Unload...
Cheonan-si, South Korea
N&K N&K 3000
- Manufacturer: N&K
n&k analyzer 3000 can simultaneously determine thickness and n&k spectra for all type of film/substrate combinations of pattrened and non-pattered wafers Non-destructive measurements of Trench Depth Thickness, Re...
Cheonan-si, South Korea