- Trusted Seller
Hitachi Kokusai Electric VR-120S
used
- Manufacturer: 国際電気アルファ（日立国際電気）
This is a resistivity measuring instrument that can measure the resistance and sheet resistance of conductive samples such as silicon wafers and This is a resistivity measuring instrument that can measure the res...
Toda, Japan - Trusted Seller
Toda, Japan - Trusted Seller
Toda, Japan - Trusted Seller
Toda, Japan - Trusted Seller
Toda, Japan - Trusted SellerToda, Japan
HORIBA, Ltd. Xtrology
new
- Manufacturer: Horiba
Fully Automated Thin Film Inspection System Combines multiple sensors and automation technology to provide increased value for semiconductor wafer inspection The new product, "Xtrology," Fully Automated Thin Film...
Kyoto, Japan
HORIBA, Ltd. PD10
new
- Manufacturer: Horiba
Reticle / Mask Particle Detection System Next-generation inspection platform to meet future needs PD10 is the latest generation of the HORIBA Particle Inspection product line. Based on an innovative modular platf...
Kyoto, Japan
HORIBA, Ltd. PD10-EX
new
- Manufacturer: Horiba
Reticle / Mask Particle Detection System Complete particle detection and removal with one machine for enhanced efficiency and yield improvement in semiconductor manufacturing processes Since its launch in 1984, t...
Kyoto, Japan
HORIBA, Ltd. RP-1
new
- Manufacturer: Horiba
Reticle/Mask Particle Remover The RP-1 automatically removes particles from the reticle/mask by air (or N2) and vacuum suction. Routinely removing the particles before the lithography process extends the replacem...
Kyoto, Japan- Tokyo, Japan
- Tokyo, Japan
2008 UNIHITE SYSTEM XVA-160
used
- Manufacturer: UNIHITE SYSTEM
Manufacturing process: examination | Inch: square base
Tokyo, Japan- Tokyo, Japan
- Tokyo, Japan
Tip: Enter manufacturer, model or keyword