Used Metrology / Inspection (Semiconductors) in Meath, Ireland

Reichert-Jung Ultracut E 70 17 04

• used

• Manufacturer: Reichert Jung

Leica / Vistec Lds 3300M

• used

• Manufacturer: Leica

VM-8000J Particle Detector

• used

Particle Detector 5"

Ionics Ionics Stress Measurement System

• used

• Manufacturer: Ionics

Used Ionics Stress System, came from lab

Technos Model Trex-610 Total Reflection Analyzer

• used

• Manufacturer: Technos

TRXRF Spectrometer

Kobelco LTA-600

• used

• Manufacturer: Kobelco
• Model: LTA-600

Metrology

SOPRA model SE 200

• used

• Manufacturer: SOPRA

Inspection System. Status: In Storage 8"

Applied Materials Verasem 3D

• used

• Manufacturer: Amat
• Model: VeraSEM

APPLIED MATERIALS (AMAT) VERASEM 3D AUTOMATED CD METROLOGY SYSTEM Wafer Specification o Wafer Size: 200MM o Wafer Shape: SNNF (Semi Notch No Flat) o Wafer : 6”, 8” or 12” Electron Optical System o Electron Gun Sc...

Sun International Sopra GESP-5

• used

• Manufacturer: International
• Model: GESP-5

Sold fully tested and in good working condition. Variable Angle Broadband Spectroscopic Ellipsometer. Ellipsometer for complicated film stacks, mapping film thickness and optical properties. Has PMT detector. Wav...

Ohkura DP2301

• used

• Manufacturer: Ohkura

profiler

P&M PNM-7600 WAFER THICKNESS MEASUREMEN

• used

• Manufacturer: P&M

KLA-TENCOR KLA2131 200mm

• used

• Manufacturer: KLA-Tencor
• Model: KLA2131

KLA-TENCOR KLA2131 Wafer size: 200mm Process: measurement

Topcon Technologies Mi-5080

• used

• Manufacturer: Topcon
• Model: MI-5080

TEL Certas

• used

• Manufacturer: Tokyo Electron - TEL
• Model: CERTAS

KLA-Tencor P2

• used

• Manufacturer: KLA-Tencor
• Model: P2

P2H Long Scan Profiler