Used Metrology / Inspection (Semiconductors) in Meath, Ireland

RUDOLPH FE-IV D Film Thickness Measurement Tool

• used

• Manufacturer: Rudolph

150MM

Canon model number: FPA-2000 i1

• used

• Manufacturer: Canon
• Model: FPA2000

model number: FPA-2000 i1 wafer: 6"

Canon Stepper model number NSR-2005i10D

• used

• Manufacturer: Canon

model number: NSR-2005i10D wafer 6"

Canon Stepper model number: FPA-1550 Mark4

• used

• Manufacturer: Canon
• Model: FPA1550

model number: FPA-1550 Mark4 wafer 6"

VISION ENG'G LYNX DYNA SCOPE

• used

• Manufacturer: VISION ENG'G

32545.0

VISION ENG'G LYNX DYNA SCOPE

• used

• Manufacturer: VISION ENG'G

30211.0

Jordan Valley BedeMetrix XRD

• used

• Manufacturer: Valley
• Model: BEDEMETRIX

De-installed, warehoused. 200mm The tool has missing parts.

UNION HISOMAT XYZ SCOPE

• used

• Manufacturer: Union

Topcon Technologies Mi-5080

• used

• Manufacturer: Topcon
• Model: MI-5080

Thermawave Opti-Probe 3290

• used

• Manufacturer: Therma-Wave

Nanometrics 210 Aft

• used

• Manufacturer: Nanometrics

Micro Instruments Pe9020

• used

• Manufacturer: Micro Instruments

Nanometrics 210 Aft

• used

• Manufacturer: Nanometrics

Leo Instruments/Cambridge S260

• used

• Manufacturer: Leo Instruments/Cambridge

Leica / Vistec Lds 3300M

• used

• Manufacturer: Leica