Used Metrology / Inspection (Semiconductors) in Wexford, Ireland

SEMILAB FAAST300 05-030330 300mm

• used

• Manufacturer: Semilab

SEMILAB FAAST300 05-030330 300mm

RUDOLPH Meta Pulse 8 Film Metrology

• used

• Manufacturer: Rudolph

RUDOLPH Meta Pulse 8″ Film Metrology

AMAT SEMVision G3 used semiconductor equipment

• used

• Manufacturer: Amat
• Model: Semvision

Revera Film Thickness and Compositional Metrology Base System

• used

• Manufacturer: Unknown

Revera Film Thickness and Compositional Metrology Base System Film Thickness and Compositional Metrology Base System

Rudolph WS3840 12 2010 3D Bump Metrology

• used

• Manufacturer: Rudolph

Rudolph WS3840 12″ 2010 3D Bump Metrology

RUDOLPH Meta Pulse 200 8 Film Metrology

• used

• Manufacturer: Rudolph

RUDOLPH Meta Pulse 200 8″ Film Metrology

EH Metrology GmbH MX 2012-69-R

• used

• Manufacturer: Unknown

E+H Metrology GmbH MX 2012-69-R

FESEM S-4700 Type II EDS METROLOGY

• used

• Manufacturer: Unknown

FESEM S-4700 Type II + EDS METROLOGY

KLA-Tencor Photomask Registration and CD Metrology System

• used

• Manufacturer: KLA-Tencor

KLA-Tencor Photomask Registration and CD Metrology System Photomask Registration and CD Metrology System

RUDOLPH Meta Pulse 8 20059 Film Metrology

• used

• Manufacturer: Rudolph

RUDOLPH Meta Pulse 8″ 2005.9 Film Metrology

EH Metrology GmbH MX 2012-69-R

• used

• Manufacturer: Unknown

E+H Metrology GmbH MX 2012-69-R

Applied Materials VeraSEM 3D used semiconductor equipment

• used

• Manufacturer: Amat
• Model: VeraSEM

Applied Materials Semvision G3 used semiconductor equipment

• used

• Manufacturer: Amat
• Model: Semvision

KLA-Tencor Scatterometry Metrology Tool NC

• used

• Manufacturer: KLA-Tencor

KLA-Tencor Scatterometry Metrology Tool, NC Scatterometry Metrology Tool, NC

HITACHI S-9220 8 CD SEM with VIPS METROLOGY

• used

• Manufacturer: Hitachi

HITACHI S-9220 8″ CD SEM with VIPS METROLOGY