Used Metrology / Inspection (Semiconductors) in Wexford, Ireland

KLA-Tencor Scatterometry Metrology Tool NC

• used

• Manufacturer: KLA-Tencor

KLA-Tencor Scatterometry Metrology Tool, NC Scatterometry Metrology Tool, NC

Rudolph FE-IV Metrology System Note currently crated in Storage

• used

• Manufacturer: Rudolph

Rudolph ‘FE-IV’ Metrology System Note currently crated in Storage.

JORDAN VALLEY JVX 7300 XRRXRDXRF system XRay Film Metrology

• used

• Manufacturer: Valley

JORDAN VALLEY JVX 7300 — XRR/XRD/XRF system XRay Film Metrology N/A 300 mm Vintage 2015

Darkfield Inspection

• used

• Manufacturer: Unknown

Applied Materials ComPLUS MP Wafer Inspection System SN T262 • Currently Configured for 300mm Wafer Sizes • MFG Date: 2004 • Process: Darkfield & Key Brightfield Inspection • Multi-Perspective Option (MP) • CE Ma...

Darkfield Inspection

• used

• Manufacturer: Unknown

• Currently configured for 300mm wafer sizes • Idle Date: 2/23/2013 • Tool status: de installed & store in the clean room • Cassette Interface: o Dual FIMS (300mm), Phoenix v1.3 o PHX Ship Kit included o Pre-Alig...

Darkfield Inspection

• used

• Manufacturer: Unknown

Tool is stored in a storage room at Towerr A in Fab 15. Double-confirmed with Fab 15 if there is one Missing part and is no modification record. Pattern Wafer Particle Defect Inspection System -Model: ComPLUS MP ...

Darkfield Inspection

• used

• Manufacturer: Unknown

• Currently Configured for 300mm wafer sizes • MFG Date: 2003 • Original UV system, upgraded to XUV • CE Marked • Install Type: Stand-Alone • Cassette Interface: o (2) Asyst ISO Port 300mm FOUP Load-ports o 25-Sl...

Darkfield Inspection

• used

• Manufacturer: Unknown

• Currently Configured for 300mm wafer sizes • MFG Date: 2003 • Original UV system, upgraded to XUV • CE Marked • Install Type: Stand-Alone • Cassette Interface: o (2) Asyst ISO Port 300mm FOUP Load-ports o 25-Sl...

Darkfield Inspection

• used

• Manufacturer: Unknown

•Currently configured for 200mm wafer sizes •Original Manufacture Date: April, 2000 •CE Marked •Handler: x2 SMIF Ports type: Asyst – INX2200 •Robot: ATM-407B-2-S-CE-S293 (Dual Puck) / Brooks (PRI) •GEM / SECS HSM...

Darkfield Inspection

• used

• Manufacturer: Unknown

• Currently Configured for 300mm wafer sizes • MFG Date: 2003 • PN: 0083710-000 • Original UV system, upgraded to XUV • Install Type: Stand-Alone • Cassette Interface: o (2) Asyst ISO Port 300mm FOUP Load-ports o...

Darkfield Inspection

• used

• Manufacturer: Unknown

• Currently configured for 200mm wafer sizes • Original Manufacture Date: Oct, 2000 • CE Marked • Handler: Configurable, To be provided based on requested configuration • GEM / SECS HSMS SFTWFR • SW (OS): ms-Wind...

Darkfield Inspection

• used

• Manufacturer: Unknown

• Currently configured for 200mm wafer sizes • Capable of processing 150-300mm wafer sizes (requires HW change) • MFG Date: 1999 • CE Marked • Originally AIT II, upgraded to XP • Cassette Interface: o Note: Custo...

Brightfield Inspection

• used

• Manufacturer: Unknown

Darkfield Inspection

• used

• Manufacturer: Unknown

Tool is stored in a storage room at Tower A in Fab 15. Confirmed with Fab 15 there are no missing & broken parts and no modification record. Light source:Diode-Pumped Solid-State Lasers Laser wavelength:532nm Obj...

Darkfield Inspection

• used

• Manufacturer: Unknown

• Currently Configured for 200mm Wafer Size • CE Marked • Software Version: 6.82 Sp1 upgraded to 6.82 Sp2 • System Options: – Additional Data Export – Auto Review – On The Fly Grouping – Repeater Analysis – Super...